ISBN: 9783540373155 - applied scanning probe methods v: scanning probe microscopy techniques (nanoscience and technology) (18 Ergebnisse)

Zustand: New. pp. xlvi + 344 1st Edition.

Zustand: New. pp. xlvi + 344.

Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Zustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.…

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 6-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.…

Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Zustand: New.

Zustand: As New. Unread book in perfect condition.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The scanning probe microscopy eld has been rapidly expanding. It is a demanding task to collect a timely overview of this eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I-IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I-IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near eld Raman spectroscopy and imaging.…

Zustand: New. pp. xlvi + 344 Illus. This item is printed on demand.

Gebunden. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book summarizing the state-of-the-art of this techniqueReal industrial applications includedThe volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. The.…

Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. 392 pp. Englisch.…

Buch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The scanning probe microscopy eld has been rapidly expanding. It is a demanding task to collect a timely overview of this eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I¿IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I¿IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near eld Raman spectroscopy and imaging.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 392 pp. Englisch.…