9786139577101 - Infrared Spectroscopic Techniques to Characterize Thin Polymer Films von Alshatteri, Azad H. (8 Ergebnisse)

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Taschenbuch. Zustand: Neu. Infrared Spectroscopic Techniques to Characterize Thin Polymer Films | Azad H. Alshatteri | Taschenbuch | 80 S. | Englisch | 2018 | LAP LAMBERT Academic Publishing | EAN 9786139577101 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The objectives of this book are to apply variable angle infrared (IR) spectroscopy in internal and external reflection mode to thin polymer films relevant to organic electronic devices. The essential objectives of this work are: to obtain infrared spectra over a range of angles of incidence for poly (methyl methacrylate) films (otherwise known as PMMA) in internal (attenuated total) and external (Reflection absorption) reflection; to compare the sensitivity of each configuration to simple models; to quantify film thickness for known thin polymer film samples to establish the reliability of infrared spectroscopy for film thickness determination; to use the calibration data obtained to study some unknown polymer brush samples both qualitatively and quantitatively. Thin PMMA films are typically used as a gate insulating layer in the manufacture of organic field effect transistor (OFET) devices used in semiconductor applications. 80 pp. Englisch.

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Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Alshatteri Azad H.Azad Alshatteri was born in Kalar in 1985. He received B.Sc. in chemistry from university of Sulaimani (2008), and my M.Sc. in Analytical Chemistry from the University of Manchester-UK (2013). Now, he is working as .

Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The objectives of this book are to apply variable angle infrared (IR) spectroscopy in internal and external reflection mode to thin polymer films relevant to organic electronic devices. The essential objectives of this work are: to obtain infrared spectra over a range of angles of incidence for poly (methyl methacrylate) films (otherwise known as PMMA) in internal (attenuated total) and external (Reflection absorption) reflection; to compare the sensitivity of each configuration to simple models; to quantify film thickness for known thin polymer film samples to establish the reliability of infrared spectroscopy for film thickness determination; to use the calibration data obtained to study some unknown polymer brush samples both qualitatively and quantitatively. Thin PMMA films are typically used as a gate insulating layer in the manufacture of organic field effect transistor (OFET) devices used in semiconductor applications.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 80 pp. Englisch.

Taschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The objectives of this book are to apply variable angle infrared (IR) spectroscopy in internal and external reflection mode to thin polymer films relevant to organic electronic devices. The essential objectives of this work are: to obtain infrared spectra over a range of angles of incidence for poly (methyl methacrylate) films (otherwise known as PMMA) in internal (attenuated total) and external (Reflection absorption) reflection; to compare the sensitivity of each configuration to simple models; to quantify film thickness for known thin polymer film samples to establish the reliability of infrared spectroscopy for film thickness determination; to use the calibration data obtained to study some unknown polymer brush samples both qualitatively and quantitatively. Thin PMMA films are typically used as a gate insulating layer in the manufacture of organic field effect transistor (OFET) devices used in semiconductor applications.