ISBN: 9789811097690 - the investigation of plastic behavior by discrete dislocation dynamics for single crystal pillar at submicron scale (springer theses) (11 Ergebnisse)

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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This thesis transports you to a wonderful and fascinating small-scale world and tells you the origin ofseveralnew phenomena. The investigative tool is the improved discrete dislocation-based multi-scale approaches, bridging the continuum modeling and atomistic simulation. Mechanism-based theoretical models are put forward to conveniently predict the mechanical responses and defect evolution. The findings presented in this thesis yield valuable new guidelines for microdevice design, reliability analysis and defect tuning. …

Taschenbuch. Zustand: Neu. The Investigation of Plastic Behavior by Discrete Dislocation Dynamics for Single Crystal Pillar at Submicron Scale | Yinan Cui | Taschenbuch | xiv | Englisch | 2018 | Springer Singapore | EAN 9789811097690 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

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Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This thesis transports you to a wonderful and fascinating small-scale world and tells you the origin ofseveralnew phenomena. The investigative tool is the improved discrete dislocation-based multi-scale approaches, bridging the continuum modeling and atomistic simulation. Mechanism-based theoretical models are put forward to conveniently predict the mechanical responses and defect evolution. The findings presented in this thesis yield valuable new guidelines for microdevice design, reliability analysis and defect tuning. 131 pp. Englisch.…

Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Nominated as an outstanding thesis by Tsinghua UniversityElucidates new, atypical, small-scale plasticity mechanismsProvides valuable guidelines for microdevice design, reliability analysis, and defect tuning.…

Zustand: New. Print on Demand pp. 131.

Zustand: New. PRINT ON DEMAND pp. 131.