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advanced scanning electron microscopy von echlin patrick (22 Ergebnisse)
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hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: Zubal-Books, Since 1961, Cleveland, OH, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: Good. Second printing, 454 pp., hardcover, ex library, else text clean and binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: West With The Night, Tucson, AZ, USA
Verkäuferbewertung 5 von 5 Sternen
Hard cover. 1986 ed. Sewn binding. Cloth over boards. 454 p. Contains: Illustrations, black & white. Audience: General/trade. Very good. No dust jacket. light shelfwear po name inside cover.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: Better World Books Ltd, Dunfermline, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Erstausgabe
EUR 7,84
EUR 9,11 für den Versand von Vereinigtes Königreich nach USAAnzahl: 1 verfügbar
In den WarenkorbZustand: Good. 1st Edition. Ships from the UK. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: The Book Spot, Sioux Falls, MN, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: New.
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Hardcover. Zustand: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: ALLBOOKS1, Direk, SA, Australien
Verkäuferbewertung 5 von 5 Sternen
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Zustand: New. pp. xii + 454.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
EUR 90,07
EUR 7,40 für den Versand von Vereinigtes Königreich nach USAAnzahl: 1 verfügbar
In den WarenkorbZustand: New. pp. xii + 454.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. pp. xii + 454.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
EUR 103,30
EUR 3,42 für den Versand innerhalb von/der USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New.
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Advanced Scanning Electron Microscopy And X-ray Microanalysis
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: ALLBOOKS1, Direk, SA, Australien
Verkäuferbewertung 5 von 5 Sternen
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 110,43
EUR 13,65 für den Versand von Vereinigtes Königreich nach USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
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EUR 93,00
EUR 48,99 für den Versand von Deutschland nach USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New.
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Advanced Scanning Electron Microscopy and X-ray Microanalysis
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 153,65
EUR 14,24 für den Versand von Vereinigtes Königreich nach USAAnzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. reprint edition. 466 pages. 8.75x6.00x0.75 inches. In Stock.
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Taschenbuch. Zustand: Neu. Advanced Scanning Electron Microscopy and X-Ray Microanalysis | Patrick Echlin (u. a.) | Taschenbuch | xii | Englisch | 2013 | Springer | EAN 9781475790290 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
EUR 208,84
EUR 28,48 für den Versand von Vereinigtes Königreich nach USAAnzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Very Good. Very Good. Ships from Multiple Locations. book.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Verlag: Springer, Springer Jun 2013, 2013
ISBN 10: 1475790295 ISBN 13: 9781475790290
Sprache: Englisch
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course. 476 pp. Englisch.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Verlag: Springer-Verlag New York Inc., 2013
ISBN 10: 1475790295 ISBN 13: 9781475790290
Sprache: Englisch
Anbieter: THE SAINT BOOKSTORE, Southport, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 134,53
EUR 19,77 für den Versand von Vereinigtes Königreich nach USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbPaperback / softback. Zustand: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 661.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Verlag: Springer US, Springer New York Jun 2013, 2013
ISBN 10: 1475790295 ISBN 13: 9781475790290
Sprache: Englisch
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 476 pp. Englisch.
