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In den WarenkorbZustand: New. pp. 256 14:B&W 6 x 9 in or 229 x 152 mm Case Laminate on White w/Gloss Lam.
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In den WarenkorbZustand: New.
Zustand: New. pp. 256.
Sprache: Englisch
Verlag: Elsevier Science Publishing Co Inc, 2013
ISBN 10: 0124095011 ISBN 13: 9780124095014
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In den WarenkorbHardback. Zustand: New. New copy - Usually dispatched within 4 working days.
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: New. pp. 256.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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In den WarenkorbZustand: As New. Unread book in perfect condition.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
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In den WarenkorbZustand: New.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
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In den WarenkorbZustand: As New. Unread book in perfect condition.
Sprache: Englisch
Verlag: Elsevier Science Publishing Co Inc, US, 2013
ISBN 10: 0124095011 ISBN 13: 9780124095014
Anbieter: Rarewaves.com USA, London, LONDO, Vereinigtes Königreich
EUR 186,75
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In den WarenkorbHardback. Zustand: New. This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics.
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In den WarenkorbGebunden. Zustand: New. Introduces English-speaking students and researchers in to the results obtained in the former Soviet/ Russian academic institutions within last few decades. Supplies a range of applications suitable for all levels from undergraduate to pro.
Sprache: Englisch
Verlag: Elsevier Science Publishing Co Inc, US, 2013
ISBN 10: 0124095011 ISBN 13: 9780124095014
Anbieter: Rarewaves.com UK, London, Vereinigtes Königreich
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In den WarenkorbHardback. Zustand: New. This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics.
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In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 252 pages. 9.25x6.25x1.00 inches. In Stock. This item is printed on demand.
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics. 256 pp. Englisch.
Sprache: Englisch
Verlag: Elsevier Science Publishing Co Inc, 2013
ISBN 10: 0124095011 ISBN 13: 9780124095014
Anbieter: THE SAINT BOOKSTORE, Southport, Vereinigtes Königreich
EUR 174,92
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In den WarenkorbHardback. Zustand: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics.