Verlag: I K International Publishing House, 2007
ISBN 10: 8189866079 ISBN 13: 9788189866075
Sprache: Englisch
Anbieter: Hay-on-Wye Booksellers, Hay-on-Wye, HEREF, Vereinigtes Königreich
EUR 4,12
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In den WarenkorbZustand: Good. Knock to bottom right corner causing some creasing.
Verlag: I K International Publishing House, 2007
ISBN 10: 8189866079 ISBN 13: 9788189866075
Sprache: Englisch
Anbieter: Hay-on-Wye Booksellers, Hay-on-Wye, HEREF, Vereinigtes Königreich
EUR 4,24
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbZustand: Very Good. A lot of scratches and some shelf wear on cover. Content is fine.
EUR 4,24
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In den WarenkorbContents 1 Introduction 2 Crystallography and Stereographic Projection 3 Generation and Nature of X rays 4 X ray Diffraction 5 Laue Techniques 6 Rotating Crystal Technique 7 Powder Techniques 8 X ray Diffractometer 9 Determination of Crystal Structure and Lattice Parameter 10 Single Crystal Orientation 11 Nature of Polycrystalline Aggregates 12 Measurement of Stress 13 Order Disorder Transformation 14 Phase Diagram Determination 15 Chemical Analysis Reference Books Index Starting with the history of the discovery of X rays by Roentgen and the subsequent formalization of diffraction laws by Von Laue Bragg and others it covers the essential fundamentals of crystallography and the theory of X ray generation and of the interaction of X rays with matter Xray diffraction theory is covered in detail serving as an excellent background to the following chapters the application procedures such as the laue the rotating crystal and the powder techniques Reciprocal lattice theory is introduced with the necessary vector algebra and the relationship between reciprocal lattice and diffraction which the student has generally some difficulty in understanding in the beginning has been brought out elegantly The chapters on film techniques are followed by one on the X ray diffract meter and its applications Specific applications such as crystal structure determination accurate determination of lattice parameters single crystal studies of crystallographic texture stress measurement orderdisorder transformation phase diagram determination are covered in sufficient detail in the next chapters There is a final chapter on the use of X ray diffraction in chemical analysis The list of topics covered is quite comprehensive The treatment of topics in each chapter is sufficiently exhaustive for undergraduate and graduate courses in X ray diffraction not only for metallurgists and materials scientists engineers but also for other disciplines requiring the study of X ray diffraction The book is very well written and the examples solved and unsolved at the end of various chapters will benefit the students greatly in understanding the concepts underlying them 276 pp.
Verlag: I K International, New Delhi, 2011
ISBN 10: 9381141541 ISBN 13: 9789381141540
Sprache: Englisch
Anbieter: Books in my Basket, New Delhi, Indien
EUR 5,37
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In den WarenkorbN.A. Zustand: New. ISBN:9789381141540.
Verlag: I K International Publishing House, 2007
ISBN 10: 8189866079 ISBN 13: 9788189866075
Sprache: Englisch
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 38,88
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 272 pages. 9.60x6.50x0.60 inches. In Stock.