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Data Mining And Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: Basi6 International, Irving, TX, USA
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Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Data Mining And Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
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Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Zustand: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: ALLBOOKS1, Direk, SA, Australien
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Data Mining and Diagnosing IC Fails.
Buch 15 von 40: Frontiers in Electronic TestingSprache: Englisch
Verlag: New York/ NY, Springer US., 2005
ISBN 10: 0387249931 ISBN 13: 9780387249933
Anbieter: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Deutschland
Verbandsmitglied: GIAQ ILAB VDA
Verkäuferbewertung 5 von 5 Sternen
2005. 16 x 24 cm. XX, 250 S. XX, 250 p. 46 illus. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. (Frontiers in Electronic Testing). Sprache: Englisch.
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Data Mining And Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: Basi6 International, Irving, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Data Mining And Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
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Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: ALLBOOKS1, Direk, SA, Australien
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Data Mining and Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: GreatBookPrices, Columbia, MD, USA
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Data Mining And Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: GreatBookPrices, Columbia, MD, USA
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: Lucky's Textbooks, Dallas, TX, USA
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EUR 102,24
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: Lucky's Textbooks, Dallas, TX, USA
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: California Books, Miami, FL, USA
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Data Mining And Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: GreatBookPrices, Columbia, MD, USA
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EUR 120,91
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Data Mining And Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
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Data Mining and Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
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EUR 124,45
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Data Mining And Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
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EUR 127,78
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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EUR 135,19
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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EUR 135,19
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing)
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: Revaluation Books, Exeter, Vereinigtes Königreich
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EUR 152,86
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In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 270 pages. 9.25x6.25x0.75 inches. In Stock.
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Data Mining and Diagnosing IC Fails
Buch 15 von 40: Frontiers in Electronic TestingSprache: Englisch
Verlag: Springer US, Springer New York Jun 2005, 2005
ISBN 10: 0387249931 ISBN 13: 9780387249933
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. Neuware -This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 272 pp. Englisch.
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Data Mining and Diagnosing IC Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done.
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Data Mining and Diagnosing IC Fails
Buch 15 von 40: Frontiers in Electronic TestingSprache: Englisch
Verlag: Springer US, Springer New York, 2005
ISBN 10: 0387249931 ISBN 13: 9780387249933
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment.
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Data Mining and Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 171,48
EUR 17,22 shipping
Versand von Vereinigtes Königreich nach USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: As New. Unread book in perfect condition.
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Data Mining and Diagnosing IC Fails (Frontiers in Electronic Testing, 31)
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
EUR 162,03
EUR 28,71 shipping
Versand von Vereinigtes Königreich nach USAAnzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: Like New. Like New. book.
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Data Mining and Diagnosing Ic Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: GreatBookPrices, Columbia, MD, USA
Verkäuferbewertung 5 von 5 Sternen
EUR 194,08
EUR 2,25 shipping
Versand innerhalb von USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: As New. Unread book in perfect condition.
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Internationale AusgabeDATA MINING AND DIAGNOSING IC FAILS (HB 2005)
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: UK BOOKS STORE, London, LONDO, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
EUR 199,19
EUR 14,90 shipping
Versand von Vereinigtes Königreich nach USAAnzahl: 1 verfügbar
In den WarenkorbZustand: New. Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Internationale Ausgabe
DATA MINING AND DIAGNOSING IC FAILS
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: UK BOOKS STORE, London, LONDO, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
EUR 230,01
EUR 14,90 shipping
Versand von Vereinigtes Königreich nach USAAnzahl: 4 verfügbar
In den WarenkorbHardcover. Zustand: New. Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Data Mining and Diagnosing IC Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done. 250 pp. Englisch.
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Data Mining and Diagnosing IC Fails
Buch 15 von 40: Frontiers in Electronic TestingAnbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -There are many techniques for analyzing IC fails, but they are scattered over the professional IC test and diagnosis literature, and in various statistics and data mining handbooks. Moreover, many data mining techniques that are standard in other data analysis environments, and that are appropriate for analyzing IC fails, have not yet been employed for that purpose. Data Mining and Diagnosing IC Fails addresses the problem of obtaining maximum information from (functional) integrated circuit fail data about the defects that caused the fails. It starts at the highest level from mere sort codes, and drills down via various data mining techniques to detailed logic diagnosis. The various approaches discussed in this book have a thorough theoretical underpinning, but are geared towards applications on real life fail data and state of the art ICs. This book brings together a large number of analysis techniques that are suitable for IC fail data, but that are not available elsewhere in a single place. Several of the techniques, in fact, have been presented only recently in technical conferences. The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that professional manufacturing engineers can implement them in their own work environment. 272 pp. Englisch.
