EUR 3,86
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In den WarenkorbHardcover. Zustand: Moyen. Ancien livre de bibliothèque. Traces d'usure sur la couverture. Edition 1986. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Acceptable. Former library book. Signs of wear on the cover. Edition 1986. Ammareal gives back up to 15% of this item's net price to charity organizations.
EUR 22,85
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In den WarenkorbZustand: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Water damaged. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0060444444.
EUR 22,85
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In den WarenkorbZustand: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Book contains pencil markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0060444444.
Verlag: Reading, MA, U.S.A.: Addison-Wesley Educational Publishers, Incorporated, 1985, 1985
ISBN 10: 0060444444 ISBN 13: 9780060444440
Sprache: Englisch
Anbieter: Bingo Used Books, Vancouver, WA, USA
EUR 4,35
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In den WarenkorbHardcover. Zustand: Very Good. Hardcover in very good + condition.
Verlag: Reading, MA, U.S.A. : Addison-Wesley Educational Publishers,., 1986
ISBN 10: 0060444444 ISBN 13: 9780060444440
Sprache: Englisch
Anbieter: Virginia Martin, aka bookwitch, Concord, CA, USA
EUR 12,20
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In den WarenkorbZustand: Very Good. Octavo, hardcover, near fine in white pictorial boards. Clean and unmarked. 414 pp New algorithms are being devised to create tests for logic circuits, and more attention is being given to design for test techniques. In this comprehensive volume the state of the art in digital system design and testing is discussed. (as per 1985). Book.
Verlag: Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1986
ISBN 10: 0471603651 ISBN 13: 9780471603658
Sprache: Englisch
Anbieter: Bingo Used Books, Vancouver, WA, USA
EUR 13,27
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In den WarenkorbHardcover. Zustand: Very Good. hardcover in very good + condition.
EUR 8,94
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In den Warenkorbhardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Verlag: Harper & Row, New York, 1985
ISBN 10: 0060444444 ISBN 13: 9780060444440
Anbieter: Between the Covers-Rare Books, Inc. ABAA, Gloucester City, NJ, USA
Erstausgabe
EUR 30,96
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In den WarenkorbHardcover. Zustand: Fine. First edition. Near fine. Spine darkened just a little.
EUR 15,92
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In den WarenkorbHardcover. Zustand: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
EUR 95,32
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In den WarenkorbHardcover. Zustand: Acceptable. Acceptable. SHIPS FROM MULTIPLE LOCATIONS. book.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 187,05
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In den WarenkorbZustand: New. In.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
EUR 182,20
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In den WarenkorbZustand: New.
EUR 169,34
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In den WarenkorbZustand: Very Good. hardcover 100% of proceeds go to charity! May have signs of use, wear and minor cosmetic defects.
EUR 188,17
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In den WarenkorbZustand: New.
EUR 222,48
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In den WarenkorbBuch. Zustand: Neu. Neuware - Your road map for meeting today s digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, 'the work required to . . . test a chip of this size approached the amount of effort required to design it.' A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: Binary Decision Diagrams (BDDs) and cycle-based simulation Tester architectures/Standard Test Interface Language (STIL) Practical algorithms written in a Hardware Design Language (HDL) Fault tolerance Behavioral Automatic Test Pattern Generation (ATPG) The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.
Verlag: John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Sprache: Englisch
Anbieter: CitiRetail, Stevenage, Vereinigtes Königreich
EUR 204,01
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In den WarenkorbHardcover. Zustand: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
Verlag: John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Sprache: Englisch
Anbieter: AussieBookSeller, Truganina, VIC, Australien
EUR 206,38
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
EUR 239,58
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In den WarenkorbZustand: New. pp. xxii + 668 Illus.
Anbieter: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irland
EUR 242,22
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In den WarenkorbZustand: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . .
EUR 186,99
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In den WarenkorbZustand: New.
EUR 255,21
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In den WarenkorbZustand: New. pp. xxii + 668 Index 2nd Edition.
Verlag: John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Sprache: Englisch
Anbieter: Grand Eagle Retail, Mason, OH, USA
EUR 222,52
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
EUR 282,11
Währung umrechnenAnzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock.
EUR 304,17
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In den WarenkorbZustand: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
EUR 358,07
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In den WarenkorbZustand: As New. Unread book in perfect condition.
EUR 348,56
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Like New. Like New. book.
EUR 386,48
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In den WarenkorbZustand: As New. Unread book in perfect condition.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 262,30
Währung umrechnenAnzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock. This item is printed on demand.