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Hardcover. Zustand: Very Good. Zustand des Schutzumschlags: Good. Condition: Book: slight shelf wear dust jacket: minor edgewear "Olesen's work on radiation effects on electronic systems is a comprehensive resource for understanding the impact of radiation on electronic devices. It is a valuable addition to the field of radiation effects and electronic systems, providing insights into the mechanisms and implications of radiation exposure on electronic components. ".
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Radiation Effects on Electronic Systems
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Radiation Effects on Electronic Systems
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Zustand: New. pp. 252.
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Radiation Effects on Electronic Systems
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In den WarenkorbPaperback. Zustand: Brand New. 249 pages. 9.10x6.00x0.30 inches. In Stock.
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Taschenbuch. Zustand: Neu. Radiation Effects on Electronic Systems | Henning L. Olesen | Taschenbuch | xv | Englisch | 2014 | Springer | EAN 9781489957078 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Radiation Effects on Electronic Systems
Sprache: Englisch
Verlag: Springer US, Springer New York, 2014
ISBN 10: 1489957073 ISBN 13: 9781489957078
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering.
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Effects of Radiation on Electronic Systems
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The Effects of Radiation on Electronic Systems
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Effects of Radiation on Electronic Systems
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
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The Effects of Radiation on Electronic Systems
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In den WarenkorbPaperback. Zustand: New. Softcover reprint of the original 1st ed. 1986.
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Effects of Radiation on Electronic Systems
Sprache: Englisch
Verlag: VAN NOSTRAND REINHOLD CO, NY, 1986
ISBN 10: 0442254172 ISBN 13: 9780442254179
Anbieter: Princeton Antiques Bookshop / Ruffolo Enterprises, Atlantic City, NJ, USA
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HARD BACK BLUE. DLV written in green marker to all page foredges DATE PUBLISHED: 1986 EDITION: 587 VERY GOOD. JACKET: VERY GOOD DJ.
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Zustand: New. pp. 608.
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Sprache: Englisch
Verlag: John Wiley and Sons Inc, US, 2015
ISBN 10: 1118479297 ISBN 13: 9781118479292
Hardback. Zustand: New. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems (IEEE Press)
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Sprache: Englisch
Verlag: John Wiley and Sons Inc, US, 2015
ISBN 10: 1118479297 ISBN 13: 9781118479292
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In den WarenkorbHardback. Zustand: New. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
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EUR 148,87
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In den WarenkorbZustand: New. Eishi, H. Ibe, Chief Researcher, Yokohama Research Laboratory, Hitachi, Ltd.Dr.Eishi Hidefumi IBE received his Ph.D degree in Nuclear Engineering from Osaka University, Japan in 1985. His expertise covers a wide area of science, such as elementary particle/.
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RADIATION EFFECTS AND SOFT ERRORS IN INTEGRATED CIRCUITS AND ELECTRONIC DEVICES (Selected Topics in Electronics and Systems)
Sprache: Englisch
Verlag: World Scientific Publishing Company, 2004
ISBN 10: 9812389407 ISBN 13: 9789812389404
Anbieter: BennettBooksLtd, Los Angeles, CA, USA
Verkäuferbewertung 5 von 5 Sternen
hardcover. Zustand: New. In shrink wrap. Looks like an interesting title!
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Environmental Radiation Effects in Ulsi Devices and Electronic Systems
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In den WarenkorbHardcover. Zustand: Brand New. 268 pages. 9.50x6.75x1.00 inches. In Stock.
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Sprache: Englisch
Verlag: John Wiley and Sons Inc, US, 2015
ISBN 10: 1118479297 ISBN 13: 9781118479292
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In den WarenkorbHardback. Zustand: New. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems (Hardcover)
Sprache: Englisch
Verlag: John Wiley & Sons Inc, New York, 2015
ISBN 10: 1118479297 ISBN 13: 9781118479292
Anbieter: CitiRetail, Stevenage, Vereinigtes Königreich
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Erstausgabe
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In den WarenkorbHardcover. Zustand: new. Hardcover. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
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Hardcover. Zustand: new. New Copy. Customer Service Guaranteed.
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The Effects of Radiation on Electronic Systems
Sprache: Englisch
Verlag: Springer Netherlands, Springer Netherlands, 2014
ISBN 10: 9401753571 ISBN 13: 9789401753579
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering.
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The Effects of Radiation on Electronic Systems
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
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EUR 224,95
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In den WarenkorbPaperback. Zustand: Brand New. reprint edition. 608 pages. 9.02x5.98x1.37 inches. In Stock.
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The Effects of Radiation on Electronic Systems
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In den WarenkorbPaperback. Zustand: New. Softcover reprint of the original 1st ed. 1986.
