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Verlag: Springer Nature Singapore, Springer Nature Singapore Okt 2024, 2024
ISBN 10: 981975268X ISBN 13: 9789819752683
Sprache: Englisch
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In den WarenkorbBuch. Zustand: Neu. Neuware -This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 372 pp. Englisch.
Verlag: Springer Nature Singapore, Springer Nature Singapore, 2024
ISBN 10: 981975268X ISBN 13: 9789819752683
Sprache: Englisch
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ISBN 10: 981975268X ISBN 13: 9789819752683
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In den WarenkorbHardcover. Zustand: new. Hardcover. This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design. This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. FPGA-Based Design and Embedded Systems; Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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ISBN 10: 981975268X ISBN 13: 9789819752683
Sprache: Englisch
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In den WarenkorbZustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in.
Verlag: Springer, Berlin, Springer Nature Singapore, Springer, 2024
ISBN 10: 981975268X ISBN 13: 9789819752683
Sprache: Englisch
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In den WarenkorbBuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the proceedings of the 27th International Symposium on VLSI Design and Test, VDAT 2023. The 32 regular papers and 16 short papers presented in this book are carefully reviewed and selected from 220 submissions. They are organized in topical sections as follows: Low-Power Integrated Circuits and Devices; FPGA-Based Design and Embedded Systems; Memory, Computing, and Processor Design; CAD for VLSI; Emerging Integrated Circuits and Systems; VLSI Testing and Security; and System-Level Design. 350 pp. Englisch.