Evaluation converter parameter using von jain manish (5 Ergebnisse)

Taschenbuch. Zustand: Neu. Evaluation of a A/D Converter Parameter using Histogram Test Technique | With effect of different error analyzed by simulation to meet practical conditions for today's digital world | Manish Jain | Taschenbuch | 80 S. | Englisch | 2019 | LAP LAMBERT Academic Publishing | EAN 9786200117632 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…

Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -ADC testing is an important activity which plays main role in deciding accuracy of a system. Many applications observe measurement using ADC. Such application entails high accuracy and resolution, thus it is provided by signal's dynamic range. The values of ADC parameters can be improved in future by increasing the number of samples, frequency and overdrive. the test algorithm can be applied to real time ADC experimental analysis. Modified code density algorithm that reduces the effect of errors on the histogram data. This algorithm can achieve the same level of accuracy as that of the conventional code-density algorithm but using a significantly smaller number of samples, which means shorter test time and lower test cost. The new method is very efficient and can be used to enable testing of high-resolution ADCs with better coverage and reduce the time and cost of testing medium-resolution ADCs. Sophisticated test instruments required for testing high resolution and high speed ADCs are expensive and bigger in size. Therefore the test methodology followed for new methods of testing is to simulate ADC transfer function with software using sine wave as stimuli inputs. 80 pp. Englisch.…

Taschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - ADC testing is an important activity which plays main role in deciding accuracy of a system. Many applications observe measurement using ADC. Such application entails high accuracy and resolution, thus it is provided by signal's dynamic range. The values of ADC parameters can be improved in future by increasing the number of samples, frequency and overdrive. the test algorithm can be applied to real time ADC experimental analysis. Modified code density algorithm that reduces the effect of errors on the histogram data. This algorithm can achieve the same level of accuracy as that of the conventional code-density algorithm but using a significantly smaller number of samples, which means shorter test time and lower test cost. The new method is very efficient and can be used to enable testing of high-resolution ADCs with better coverage and reduce the time and cost of testing medium-resolution ADCs. Sophisticated test instruments required for testing high resolution and high speed ADCs are expensive and bigger in size. Therefore the test methodology followed for new methods of testing is to simulate ADC transfer function with software using sine wave as stimuli inputs.…

Kartoniert / Broschiert. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Jain Dr. ManishDr. MANISH JAIN Associate Professor, EEE Department, Mandsaur University, Mandsaur (M.P.) obtained PhD in 2015 in ECE. He has published more than 30 papers in International journal and listed in IEEE conference Procee.…

Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -ADC testing is an important activity which plays main role in deciding accuracy of a system. Many applications observe measurement using ADC. Such application entails high accuracy and resolution, thus it is provided by signal's dynamic range. The values of ADC parameters can be improved in future by increasing the number of samples, frequency and overdrive. the test algorithm can be applied to real time ADC experimental analysis. Modified code density algorithm that reduces the effect of errors on the histogram data. This algorithm can achieve the same level of accuracy as that of the conventional code-density algorithm but using a significantly smaller number of samples, which means shorter test time and lower test cost. The new method is very efficient and can be used to enable testing of high-resolution ADCs with better coverage and reduce the time and cost of testing medium-resolution ADCs. Sophisticated test instruments required for testing high resolution and high speed ADCs are expensive and bigger in size. Therefore the test methodology followed for new methods of testing is to simulate ADC transfer function with software using sine wave as stimuli inputs.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 80 pp. Englisch.…