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In den WarenkorbXX, 197 p. Softcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Computer Architecture and Design Methodologies. Sprache: Englisch.
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In den WarenkorbZustand: New.
Verlag: Springer Verlag, Singapore, Singapore, 2018
ISBN 10: 9811093210 ISBN 13: 9789811093210
Sprache: Englisch
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In den WarenkorbPaperback. Zustand: new. Paperback. This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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In den WarenkorbZustand: New. In.
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In den WarenkorbZustand: New.
Verlag: Springer Verlag, Singapore, Singapore, 2017
ISBN 10: 9811010722 ISBN 13: 9789811010729
Sprache: Englisch
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In den WarenkorbHardcover. Zustand: new. Hardcover. This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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In den WarenkorbZustand: New. In.
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In den WarenkorbZustand: New. pp. 217.
Anbieter: moluna, Greven, Deutschland
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In den WarenkorbZustand: New.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
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In den WarenkorbPaperback. Zustand: Brand New. reprint edition. 197 pages. 9.25x6.10x0.47 inches. In Stock.
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In den WarenkorbHardcover. Zustand: Brand New. 217 pages. 9.25x6.10x0.56 inches. In Stock.
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In den WarenkorbZustand: New.
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In den WarenkorbPaperback. Zustand: New. New. book.
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In den WarenkorbHardcover. Zustand: New. New. book.
Verlag: Springer Verlag, Singapore, Singapore, 2018
ISBN 10: 9811093210 ISBN 13: 9789811093210
Sprache: Englisch
Anbieter: AussieBookSeller, Truganina, VIC, Australien
EUR 256,13
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In den WarenkorbPaperback. Zustand: new. Paperback. This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Verlag: Springer Verlag, Singapore, Singapore, 2017
ISBN 10: 9811010722 ISBN 13: 9789811010729
Sprache: Englisch
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In den WarenkorbHardcover. Zustand: new. Hardcover. This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 142,52
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In den WarenkorbZustand: New. Print on Demand pp. 217.
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
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In den WarenkorbZustand: New. PRINT ON DEMAND pp. 217.
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