Identification defects semiconductors (9 Ergebnisse)

Hardcover. Zustand: UsedGood. Hardcover; symposium held April 15-18, 1985, in San Francisco; fading and s helf wear to exterior; binding slightly cocked; scrape to side edge of fron t cover; note written on table of contents page, otherwise text is clean; f ormer owner's stamping inside rear board; contents in good condition.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 434 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.

Hardcover. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Paperback. Zustand: Brand New. 396 pages. 9.00x5.75x0.90 inches. In Stock.

Hardcover. Zustand: New. No Jacket. 1st Edition. Academic Press (1998). New Hardcover, no dj. Naroon cloth Gilt Front and Spine titles. 9.25"x6.25"x1.1". be42744.

Hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority.

Hardcover. Zustand: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority.