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Materials Characterization for Process Control and Product Conformity
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 9,87
EUR 15,34 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 1 verfügbar
In den WarenkorbZustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:0849389577.
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Vlsi Electronics Microstructure Science Volume 6: Materials and Process Characterization
Anbieter: Daedalus Books, Portland, OR, USA
Verbandsmitglied: CBA
Verkäuferbewertung 5 von 5 Sternen
Erstausgabe
Hardcover. Zustand: Very Good. Zustand des Schutzumschlags: No Dust Jacket. First Edition. Name penned to top edge. A nice, crisp copy. ; 8vo ; 601 pages.
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Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability (Synthesis Lectures on Solid State Materials and Devices)
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New.
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Zustand: New. 1st edition NO-PA16APR2015-KAP.
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Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability (Synthesis Lectures on Solid State Materials and Devices)
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 33,00
EUR 13,71 shipping
Ships from Vereinigtes Königreich to USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In English.
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Vlsi Electronics Microstructure Science Volume 6 : Materials and Process Characterization
Anbieter: Feldman's Books, Menlo Park, CA, USA
Verkäuferbewertung 5 von 5 Sternen
Erstausgabe
Hardcover. Zustand: Fine. 1st Edition. No Markings.
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Advanced Characterization and On-Line Process Monitoring of Additively Manufactured Materials and Components
Anbieter: California Books, Miami, FL, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New.
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Advanced Characterization and On-Line Process Monitoring of Additively Manufactured Materials and Components
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 71,64
EUR 13,71 shipping
Ships from Vereinigtes Königreich to USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
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Process-Induced Phase Separation in Polymer Blends: Materials, Characterization, Properties, and Applications
Anbieter: Big River Books, Powder Springs, GA, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: very_good. This book is in Very Good condition. The cover and pages have minor shelf wear. Binding is tight and pages are intact.
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Purification Process and Characterization of Ultra High Purity Metals: Application of Basic Science to Metallurgical Processing (Springer Series in Materials Processing)
Buch 3 von 4: Springer Series in Materials ProcessingAnbieter: Lucky's Textbooks, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: New.
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Purification Process and Characterization of Ultra High Purity Metals: Application of Basic Science to Metallurgical Processing (Springer Series in Materials Processing)
Buch 3 von 4: Springer Series in Materials ProcessingAnbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 111,19
EUR 13,71 shipping
Ships from Vereinigtes Königreich to USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
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Materials and Process Characterization: VLSI Electronics Microstructure Science, Vol. 6
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 115,84
EUR 17,17 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 614 pages. 9.25x6.00x1.39 inches. In Stock.
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Chemistry of Superconductor Materials: Preparation, Chemistry, Characterization, and Theory (Materials Science and Process Technology Series)
Anbieter: Stephen White Books, Bradford, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 124,19
EUR 38,06 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Good. Ex-library book, usual markings. Clean copy in good condition. Quick dispatch from UK seller.
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Taschenbuch. Zustand: Neu. Fundamentals of Bias Temperature Instability in MOS Transistors | Characterization Methods, Process and Materials Impact, DC and AC Modeling | Souvik Mahapatra | Taschenbuch | xvi | Englisch | 2016 | Springer | EAN 9788132234241 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Process-Induced Phase Separation In Polymer Blends Materials, Characterization, Properties, And Applications
Anbieter: Basi6 International, Irving, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Fundamentals of Bias Temperature Instability in MOS Transistors : Characterization Methods, Process and Materials Impact, DC and AC Modeling
Verlag: Springer India, Springer India, 2016
ISBN 10: 8132234243 ISBN 13: 9788132234241
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based models for accurate determination of degradation at end-of-life and understanding the gate insulator process impact on BTI. This book discusses different ultra-fast characterization techniques for recovery artefact free BTI measurements. It also covers different direct measurements techniques to access pre-existing and newly generated gate insulator traps responsible for BTI. The book provides a consistent physical framework for NBTI and PBTI respectively for p- and n- channel MOSFETs, consisting of trap generation and trapping. A physics-based compact model is presented to estimate measured BTI degradation in planar Si MOSFETs having differently processed SiON and HKMG gate insulators, in planar SiGe MOSFETs and also in Si FinFETs. The contents also include a detailed investigation of the gate insulator process dependence of BTI in differently processed SiON and HKMG MOSFETs. The book then goes on to discuss Reaction-Diffusion (RD) model to estimate generation of new traps for DC and AC NBTI stress and Transient Trap Occupancy Model (TTOM) to estimate charge occupancy of generated traps and their contribution to BTI degradation. Finally, a comprehensive NBTI modeling framework including TTOM enabled RD model and hole trapping to predict time evolution of BTI degradation and recovery during and after DC stress for different stress and recovery biases and temperature, during consecutive arbitrary stress and recovery cycles and during AC stress at different frequency and duty cycle. The contents of this book should prove useful to academia and professionals alike.
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Fundamentals of Bias Temperature Instability in MOS Transistors : Characterization Methods, Process and Materials Impact, DC and AC Modeling
Verlag: Springer India, Springer India, 2015
ISBN 10: 8132225074 ISBN 13: 9788132225072
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Verkäuferbewertung 5 von 5 Sternen
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based models for accurate determination of degradation at end-of-life and understanding the gate insulator process impact on BTI. This book discusses different ultra-fast characterization techniques for recovery artefact free BTI measurements. It also covers different direct measurements techniques to access pre-existing and newly generated gate insulator traps responsible for BTI. The book provides a consistent physical framework for NBTI and PBTI respectively for p- and n- channel MOSFETs, consisting of trap generation and trapping. A physics-based compact model is presented to estimate measured BTI degradation in planar Si MOSFETs having differently processed SiON and HKMG gate insulators, in planar SiGe MOSFETs and also in Si FinFETs. The contents also include a detailed investigation of the gate insulator process dependence of BTI in differently processed SiON and HKMG MOSFETs. The book then goes on to discuss Reaction-Diffusion (RD) model to estimate generation of new traps for DC and AC NBTI stress and Transient Trap Occupancy Model (TTOM) to estimate charge occupancy of generated traps and their contribution to BTI degradation. Finally, a comprehensive NBTI modeling framework including TTOM enabled RD model and hole trapping to predict time evolution of BTI degradation and recovery during and after DC stress for different stress and recovery biases and temperature, during consecutive arbitrary stress and recovery cycles and during AC stress at different frequency and duty cycle. The contents of this book should prove useful to academia and professionals alike.
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Sonderangebot
EUR 74,31
EUR 105,00 shipping
Ships from Deutschland to USAAnzahl: 1 verfügbar
In den WarenkorbZustand: Sehr gut. Zustand: Sehr gut | Seiten: 288 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling (Springer Series in Advanced Microelectronics)
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
EUR 160,36
EUR 28,62 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Like New. Like New. book.
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Hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Process-Induced Phase Separation in Polymer Blends: Materials, Characterization, Properties, and Applications
Anbieter: ALLBOOKS1, Direk, SA, Australien
Verkäuferbewertung 5 von 5 Sternen
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 168,27
EUR 28,62 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. reprint edition. 269 pages. 9.25x6.10x0.68 inches. In Stock.
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Internationale AusgabeMATERIALS CHARACTERIZATION FOR PROCESS CONTROL AND PRODUCT CONFORMITY
Anbieter: UK BOOKS STORE, London, LONDO, Vereinigtes Königreich
Verkäuferbewertung 4 von 5 Sternen
EUR 190,53
EUR 14,86 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 1 verfügbar
In den WarenkorbZustand: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Process-Induced Phase Separation in Polymer Blends: Materials, Characterization, Properties, and Applications
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 198,92
EUR 11,45 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 211 pages. 9.61x6.93x0.75 inches. In Stock.
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Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 197,29
EUR 28,62 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. reprint edition. 269 pages. 9.25x6.10x0.68 inches. In Stock.
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Soils and Waves: Particulate Materials Behavior, Characterization and Process Monitoring (Lasers and Fibre Optics Series)
Anbieter: Phatpocket Limited, Waltham Abbey, HERTS, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 250,22
EUR 12,18 shipping
Ships from Vereinigtes Königreich to USAAnzahl: 1 verfügbar
In den WarenkorbZustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
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Soils and Waves: Particulate Materials Behavior, Characterization and Process Monitoring
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 270,20
EUR 13,71 shipping
Ships from Vereinigtes Königreich to USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
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Soils and Waves : Particulate Materials Behavior, Characterization and Process Monitoring
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 270,18
EUR 17,17 shipping
Ships from Vereinigtes Königreich to USAAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New.
