Memory microprocessor asic (23 Ergebnisse)

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HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

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Zustand: New. Timing, memory, power dissipation, testing, and testability are crucial elements of VLSI circuit design. This title treats stacked gate, embedded, and flash memory, including their power consumption and developments in low-power memories. It provides a chapter to deal with the topic of application-specific integrated circuits (ASICs). Editor(s): Chen, Wai-Kai. Series: Principles and Applications in Engineering. Num Pages: 384 pages, 277 black & white illustrations, 33 black & white tables. BIC Classification: TJFC; TJFD1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 254 x 178 x 26. Weight in Grams: 839. . 2003. Hardback. . . . .…

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Zustand: New. pp. 384 1st edition.

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Zustand: Gut. Zustand: Gut | Seiten: 384 | Sprache: Englisch | Produktart: Bücher | Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools.…

Hardback. Zustand: New. Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools. …

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Zustand: New. Wai-Kai ChenTiming, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and rel.

Zustand: New. pp. 384.

Zustand: New. Timing, memory, power dissipation, testing, and testability are crucial elements of VLSI circuit design. This title treats stacked gate, embedded, and flash memory, including their power consumption and developments in low-power memories. It provides a chapter to deal with the topic of application-specific integrated circuits (ASICs). Editor(s): Chen, Wai-Kai. Series: Principles and Applications in Engineering. Num Pages: 384 pages, 277 black & white illustrations, 33 black & white tables. BIC Classification: TJFC; TJFD1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 254 x 178 x 26. Weight in Grams: 839. . 2003. Hardback. . . . . Books ship from the US and Ireland.…

Hardback. Zustand: New. Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools. …

Hardcover. Zustand: Brand New. 1st edition. 384 pages. 10.25x7.00x1.00 inches. In Stock.

Zustand: New. pp. 384 Illus. This item is printed on demand.

Hardcover. Zustand: Brand New. 1st edition. 384 pages. 10.25x7.00x1.00 inches. In Stock. This item is printed on demand.

Buch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools.…

Buch. Zustand: Neu. Memory, Microprocessor, and ASIC | Wai-Kai Chen | Buch | Einband - fest (Hardcover) | Englisch | 2003 | CRC Press | EAN 9780849317378 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.