Anbieter: Gate City Books, GREENSBORO, NC, USA
Zustand: good. USED book in GOOD condition. Great binding, pages and cover show normal signs of wear from use.
Anbieter: Solr Books, Lincolnwood, IL, USA
Zustand: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
Anbieter: Books Puddle, New York, NY, USA
Zustand: New. pp. xv + 296.
Hardcover. Zustand: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 79,13
Anzahl: 1 verfügbar
In den WarenkorbZustand: New. pp. xv + 296 Illus.
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: New. pp. xv + 296.
Anbieter: ALLBOOKS1, Direk, SA, Australien
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Zustand: New.
EUR 162,28
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. Cutting-edge Design for Manufacturability Techniques for Nanoscale CMOS VLSI CircuitsCutting-edge Design for Manufacturability Techniques for Nanoscale CMOS VLSI Circuits Covering defect analysis, equipment, and lithographic control evaluations, t.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - Cutting-edge Design for Manufacturability Techniques for Nanoscale CMOS VLSI Circuits Covering defect analysis, equipment, and lithographic control evaluations, this book offers a holistic approach for VLSI circuit designers to evaluate and analyze IC circuit designs from the manufacturability point of view. This practical guide is ideal for design engineers, managers, students, and academics interested in understanding the sources of semiconductor chip failures and how these problems can be mitigated through design.