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pattern recognition machine learning (876 Ergebnisse)
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Verkäuferbewertung
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Machine Learning: An Algorithmic Perspective (Chapman & Hall/Crc Machine Learning & Pattern Recognition)
Anbieter: ThriftBooks-Phoenix, Phoenix, AZ, USA
Verkäuferbewertung 5 von 5 Sternen
Paperback. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Machine Learning: An Algorithmic Perspective (Chapman & Hall/Crc Machine Learning & Pattern Recognition)
Anbieter: ThriftBooks-Atlanta, AUSTELL, GA, USA
Verkäuferbewertung 5 von 5 Sternen
Paperback. Zustand: As New. No Jacket. Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less.
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Paperback. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Machine Learning: An Algorithmic Perspective (Chapman & Hall/Crc Machine Learning & Pattern Recognition)
Anbieter: ThriftBooks-Atlanta, AUSTELL, GA, USA
Verkäuferbewertung 5 von 5 Sternen
Paperback. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Machine Learning: An Algorithmic Perspective (Chapman & Hall/Crc Machine Learning & Pattern Recognition)
Anbieter: Goodwill Books, Hillsboro, OR, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: acceptable. Fairly worn, but readable and intact. If applicable: Dust jacket, disc or access code may not be included.
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Machine Learning: An Algorithmic Perspective (Chapman & Hall/Crc Machine Learning & Pattern Recognition)
Anbieter: ThriftBooks-Dallas, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Paperback. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Paperback. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Sequential methods in pattern recognition and machine learning, Volume 52 (Mathematics in Science and Engineering)
Anbieter: GuthrieBooks, Spring Branch, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Good. Ex-library hardcover no dj (maroon boards) in nice condition with the usual library markings and attachments. Except for library markings, interior clean and unmarked. Tight binding.
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A First Course in Machine Learning (Chapman & Hall/Crc Machine Learning & Pattern Recognition)
Buch 2 von 15: Chapman & Hall/Crc Machine Learning & Pattern RecognitionAnbieter: WorldofBooks, Goring-By-Sea, WS, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
EUR 5,19
EUR 6,42 shipping
Versand von Vereinigtes Königreich nach USAAnzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Very Good. The book has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged.
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Pattern Recognition and Machine Learning: Proceedings of the Japan?U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18â"20, 1970
Anbieter: ThriftBooks-Dallas, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Very Good. No Jacket. Former library book; Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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paperback. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Practical Machine Learning and Image Processing: For Facial Recognition, Object Detection, and Pattern Recognition Using Python
Anbieter: ThriftBooks-Atlanta, AUSTELL, GA, USA
Verkäuferbewertung 5 von 5 Sternen
Paperback. Zustand: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.
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Pattern Recognition and Machine Learning: Proceedings of the Japan?U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18?20, 1970
Anbieter: GuthrieBooks, Spring Branch, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Very Good. Ex-Library hardcover no dj (blue boards) in very nice condition with the usual markings and attachments. Sunned spine. Except for library markings, interior clean and unmarked. Tight binding.
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Pattern Recognition and Machine Learning: Proceedings of the Japan?U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18?20, 1970
Anbieter: GuthrieBooks, Spring Branch, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Very Good. Ex-Library hardcover no dj (blue boards) in very nice condition with the usual markings and attachments. Sunned spine. Except for library markings, interior clean and unmarked. Tight binding.
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Paperback. Zustand: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority!
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Practical Machine Learning and Image Processing: For Facial Recognition, Object Detection, and Pattern Recognition Using Python
Anbieter: Meadowland Media, Fayetteville, AR, USA
Verkäuferbewertung 5 von 5 Sternen
paperback. IT'S NEW - WE SHIP DAILY WITH TR.
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Machine Learning and Data Mining in Pattern Recognition: 4th International Conference, MLDM 2005, Leipzig, Germany, July 9-11, 2005, Proceedings . / Lecture Notes in Artificial Intelligence)
Anbieter: GuthrieBooks, Spring Branch, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Paperback. Zustand: Very Good. Ex-library paperback in very nice condition with the usual markings and attachments.
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Hardcover. Zustand: Fine. 1st Edition. HARDCOVER, LIKE NEW.
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Pattern Recognition and Machine Learning: Proceedings of the Japan?U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan August 18â"20, 1970
Anbieter: Books From California, Simi Valley, CA, USA
Verkäuferbewertung 5 von 5 Sternen
hardcover. Zustand: Good.
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Hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Ensemble Methods (Chapman & Hall/CRC Machine Learning & Pattern Recognition)
Buch 3 von 15: Chapman & Hall/Crc Machine Learning & Pattern RecognitionSprache: Englisch
Verlag: Chapman and Hall/CRC (edition 1), 2012
ISBN 10: 1439830037 ISBN 13: 9781439830031
Hardcover. Zustand: Good. 1. It's a preowned item in good condition and includes all the pages. It may have some general signs of wear and tear, such as markings, highlighting, slight damage to the cover, minimal wear to the binding, etc., but they will not affect the overall reading experience.
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Hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Zustand: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
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Pattern Recognition and Machine Learning (Information Science and Statistics)
Anbieter: thebookforest.com, San Rafael, CA, USA
Verkäuferbewertung 4 von 5 Sternen
Zustand: Good. LIght underlining and highlighting, mild shelf wear. Used - Good.
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INTRODUCTION TO PATTERN RECOGNITION AND MACHINE LEARNING (Iisc Lecture Notes)
Sprache: Englisch
Verlag: World Scientific Publishing Comp, 2014
ISBN 10: 9814335452 ISBN 13: 9789814335454
Anbieter: suffolkbooks, Center moriches, NY, USA
Verkäuferbewertung 4 von 5 Sternen
hardcover. Zustand: Good. Fast Shipping - Safe and Secure 7 days a week!
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Paperback. Zustand: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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Bayesian Programming (Chapman & Hall/CRC Machine Learning & Pattern Recognition)
Buch 5 von 15: Chapman & Hall/Crc Machine Learning & Pattern RecognitionAnbieter: World of Books (was SecondSale), Montgomery, IL, USA
Verkäuferbewertung 5 von 5 Sternen
Zustand: Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc.
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Ensemble Methods (Chapman & Hall/CRC Machine Learning & Pattern Recognition)
Buch 3 von 15: Chapman & Hall/Crc Machine Learning & Pattern RecognitionAnbieter: Textbooks_Source, Columbia, MO, USA
Verkäuferbewertung 5 von 5 Sternen
Erstausgabe
hardcover. Zustand: Good. 1st Edition. Ships in a BOX from Central Missouri! May not include working access code. Will not include dust jacket. Has used sticker(s) and some writing or highlighting. UPS shipping for most packages, (Priority Mail for AK/HI/APO/PO Boxes).
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Introduction to Pattern Recognition & Machine Learning by Murty & Devi
Sprache: Englisch
Verlag: World Scientific Publishing Company, 2014
ISBN 10: 9814335452 ISBN 13: 9789814335454
Anbieter: Big Star Books, Santa Fe, NM, USA
Verkäuferbewertung 5 von 5 Sternen
hardcover. Zustand: Very Good. Clean, unmarked, tightly bound. Light wear. Stamp on page edges. Photos available. We ship daily. Expedited shipping available! (Heavy books & sets may require extra shipping charges.).
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Machine Learning: An Algorithmic Perspective, Second Edition (Chapman & Hall/CRC Machine Learning & Pattern Recognition)
Buch 6 von 15: Chapman & Hall/Crc Machine Learning & Pattern RecognitionSprache: Englisch
Verlag: Chapman and Hall/CRC (edition 2), 2014
ISBN 10: 1466583282 ISBN 13: 9781466583283
Hardcover. Zustand: Good. 2. It's a preowned item in good condition and includes all the pages. It may have some general signs of wear and tear, such as markings, highlighting, slight damage to the cover, minimal wear to the binding, etc., but they will not affect the overall reading experience.
