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Buch. Zustand: Neu. Neuware -This instructive guide to scanning electron microscopy helps to master the different modes of this powerful analytical technique, with an abundance of hands-on practical advice. 396 pp. Englisch.
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch. Zustand: Neu. Neuware -This instructive guide to scanning electron microscopy helps to master the different modes of this powerful analytical technique, with an abundance of hands-on practical advice. 396 pp. Englisch.
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Buch. Zustand: Neu. Neuware -A concise and authoritative introduction to scanning electron microscopy in the biological sciences.
Anbieter: moluna, Greven, Deutschland
Zustand: New. Gerhard Wanner studied biology at Ludwigs Maximilian University in Munich (Germany), where he obtained his habilitation in 1992 and is now an Emeritus Professor of Ultrastructural Analysis at the Institute of Botany.His main research interest is the analysi.
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Taschenbuch. Zustand: Neu. Practical Scanning Electron Microscopy | Electron and Ion Microprobe Analysis | Joseph Goldstein | Taschenbuch | xviii | Englisch | 2011 | Springer | EAN 9781461344247 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Verlag: Springer US, Springer US Okt 2011, 2011
ISBN 10: 1461344247 ISBN 13: 9781461344247
Sprache: Englisch
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Taschenbuch. Zustand: Neu. Neuware -In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 604 pp. Englisch.
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In den WarenkorbPaperback. Zustand: Brand New. 604 pages. 8.98x6.06x1.42 inches. In Stock.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
Anbieter: preigu, Osnabrück, Deutschland
Buch. Zustand: Neu. A Practical Guide to Scanning Electron Microscopy in the Biosciences | Gerhard Wanner | Buch | 416 S. | Englisch | 2022 | Wiley-VCH GmbH | EAN 9783527350490 | Verantwortliche Person für die EU: Wiley-VCH GmbH, Boschstr. 12, 69469 Weinheim, product-safety[at]wiley[dot]com | Anbieter: preigu.
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Buch. Zustand: Neu. Neuware -A concise and authoritative introduction to scanning electron microscopy in the biological sciencesWiley-VCH GmbH, Boschstr. 12, 69469 Weinheim 396 pp. Englisch.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - This instructive guide to scanning electron microscopy helps to master the different modes of this powerful analytical technique, with an abundance of hands-on practical advice.
Verlag: Electronic Industry Press, 2022
ISBN 10: 7121428776 ISBN 13: 9787121428777
Sprache: Englisch
Anbieter: liu xing, Nanjing, JS, China
paperback. Zustand: New. Paperback.Pub Date:2022-03-01 Pages:500 Language:Chinese Publisher:Electronic Industry Press This book introduces the basic principles of scanning electron microscopes and energy spectrometers and some typical examples in practical work from the perspective of application. application. Whole book is divided into upper. lower two and some relevant appendices. The first part includes chapters 1 to 9. It mainly discusses the principle. structure. operation points and several common image quality.
Verlag: Electronic Industry Press, 2022
ISBN 10: 7121428776 ISBN 13: 9787121428777
Sprache: Chinesisch
Anbieter: liu xing, Nanjing, JS, China
paperback. Zustand: New. Paperback.Pub Date:2022-03-01 Pages:500 Language:Chinese Publisher:Electronic Industry Press This book introduces the basic principles of scanning electron microscopes and energy spectrometers and some typical examples in practical work from the perspective of application. application. Whole book is divided into upper. lower two and some relevant appendices. The first part includes chapters 1 to 9. It mainly discusses the principle. structure. operation points and several common image quality.
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end. 604 pp. Englisch.