Anbieter: Buchpark, Trebbin, Deutschland
Zustand: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Gebundene Ausgabe. Zustand: Sehr gut. 196 Seiten Cover leicht berieben und kleine Lagerspuren am Buch, Inhalt einwandfrei und ungelesen Sprache: Englisch Gewicht in Gramm: 490.
Anbieter: PBShop.store UK, Fairford, GLOS, Vereinigtes Königreich
EUR 201,87
Anzahl: 1 verfügbar
In den WarenkorbHRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.
Zustand: New.
Anbieter: PBShop.store US, Wood Dale, IL, USA
HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.
Zustand: As New. Unread book in perfect condition.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
EUR 201,86
Anzahl: 10 verfügbar
In den WarenkorbZustand: New.
Anbieter: Chiron Media, Wallingford, Vereinigtes Königreich
EUR 211,25
Anzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: New.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 218,27
Anzahl: 1 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes Königreich
EUR 214,28
Anzahl: 10 verfügbar
In den WarenkorbZustand: As New. Unread book in perfect condition.
Zustand: New. pp. 196.
Zustand: New. 1999. 1st Edition. hardcover. . . . . .
Sprache: Englisch
Verlag: Taylor and Francis Ltd, GB, 1999
ISBN 10: 075030538X ISBN 13: 9780750305389
Anbieter: Rarewaves.com USA, London, LONDO, Vereinigtes Königreich
EUR 264,18
Anzahl: 1 verfügbar
In den WarenkorbHardback. Zustand: New. Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work.The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.
Anbieter: Biblios, Frankfurt am main, HESSE, Deutschland
Zustand: New. pp. 196.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 260,85
Anzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 196 pages. 9.50x6.25x0.75 inches. In Stock.
Anbieter: moluna, Greven, Deutschland
Zustand: New. Peter. B HirschTopics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today s heads of department and was a pioneer in the develo.
Sprache: Englisch
Verlag: Taylor & Francis Ltd Jan 1999, 1999
ISBN 10: 075030538X ISBN 13: 9780750305389
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - This book has been written following a festschrift held on Prof Mike Whelan's retirement from the University of Oxford. It brought together a who's who of electron microscopists all of whom have advanced the uses of microscopy to study materials. Contributions include: Hirsch on the history and impact of electron microscopy in Materials Science; Cockayne (University of Sydney, Australia) writes on weak-beam techniques for problem solving, understanding defect structures and dislocation interactions; Moodie (Royal Melbourne Institute of Technology) investigates how to use beam diffraction patterns to look at defects in structures; Hashimoto (Okayama University of Science) shows how to obtain chemical identification at atomic resolution; Dudarev (Oxford) outlines theoretical developments in back sctarring channeling patterns; Humphreys (Cambridge) finds new ways to look at atomic bonds; Howie (Cambridge) uses numerical simulations to look at electronic structure of crystals; Peng (Chinese Academy of Sciences) illuminates Rheed observations for MBE growth; and Spence (Arizona State) speculates on atomic level imaging. applications; novel.
Zustand: New. 1999. 1st Edition. hardcover. . . . . . Books ship from the US and Ireland.
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
EUR 282,44
Anzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Sprache: Englisch
Verlag: Taylor and Francis Ltd, GB, 1999
ISBN 10: 075030538X ISBN 13: 9780750305389
Anbieter: Rarewaves.com UK, London, Vereinigtes Königreich
EUR 248,92
Anzahl: 1 verfügbar
In den WarenkorbHardback. Zustand: New. Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work.The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.
Anbieter: preigu, Osnabrück, Deutschland
Buch. Zustand: Neu. Topics in Electron Diffraction and Microscopy of Materials | P. B. Hirsch | Buch | Series in Microscopy in Materials Science | Einband - fest (Hardcover) | Englisch | 1999 | CRC Press | EAN 9780750305389 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 227,19
Anzahl: 3 verfügbar
In den WarenkorbZustand: New. pp. 196 This item is printed on demand.