Transmission electron microscopy diffraction (69 Ergebnisse)

Soft cover. Zustand: Fair. 222 numbered pages; A thesis by Paul Vincent Guthrie, Jr.; hole-punched to put in notebook; bound at this time by 3 stainless steel pins; minor age tan to text; med age tan and numerous speck/ marks to edges of closed pages; medium wear to edges of cover; medium handgrime to cover; a number of minor marks to cover; 1/4 inch tear to back cover; ex-library; weighs 2.25 pounds; measures 10.8 by 8.5 by .8 inches; 091813; inventory control: SB.…

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Paperback. Zustand: New. The structure-property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the author's course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering. …

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paperback. Zustand: New. Language:Chinese.Paperback. Pub Date: 2024-06 Pages: 240 Publisher: Metallurgical Industry Press This book consists of 3 parts. The first part is an introduction to crystallography. including the periodicity of crystals and Bravais lattices. the symmetry. point groups and space groups of crystals. examples of reciprocal lattices and crystal structure characterization; the second part is the X-ray diffraction of materials. including the geometric principles of X-ray diffraction. the diffractio.…

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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduatelevel text in support of course materials in Materials Science, Physics or Chemistry departments.…

Taschenbuch. Zustand: Neu. Advanced Transmission Electron Microscopy | Imaging and Diffraction in Nanoscience | Jian Min Zuo (u. a.) | Taschenbuch | xxvi | Englisch | 2018 | Springer | EAN 9781493982493 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

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