EUR 40,00
Währung umrechnenAnzahl: 1 verfügbar
In den Warenkorb8°, gebundene Ausgabe. Zustand: Gut. IX/419 Seiten : Ausgetragenes Bibliotheksexemplar, Deckel mit Schutzfolie DE-40-01 Sprache: Englisch Gewicht in Gramm: 964.
Anbieter: GreatBookPrices, Columbia, MD, USA
EUR 54,38
Währung umrechnenAnzahl: 15 verfügbar
In den WarenkorbZustand: New.
Verlag: Springer-Verlag New York Inc., New York, NY, 2012
ISBN 10: 1461376963 ISBN 13: 9781461376965
Sprache: Englisch
Anbieter: Grand Eagle Retail, Bensenville, IL, USA
EUR 56,73
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: new. Paperback. This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and X-ray and neutron interferometry. Proceedings of a NATO ASI held in Erice, Italy, April 9-21, 1996 Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Anbieter: Lucky's Textbooks, Dallas, TX, USA
EUR 53,26
Währung umrechnenAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New.
Anbieter: GreatBookPrices, Columbia, MD, USA
EUR 62,09
Währung umrechnenAnzahl: 15 verfügbar
In den WarenkorbZustand: As New. Unread book in perfect condition.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 58,09
Währung umrechnenAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: Chiron Media, Wallingford, Vereinigtes Königreich
EUR 56,74
Währung umrechnenAnzahl: 10 verfügbar
In den WarenkorbPF. Zustand: New.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
EUR 59,97
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbTaschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This volume collects the proceedings of the 23rd International Course of Crystallography, entitled 'X-ray and Neutron Dynamical Diffraction, Theory and Applications,' which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: - the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, - the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and - X-ray and neutron interferometry.
Verlag: Springer-Verlag New York Inc., New York, NY, 2012
ISBN 10: 1461376963 ISBN 13: 9781461376965
Sprache: Englisch
Anbieter: AussieBookSeller, Truganina, VIC, Australien
EUR 115,49
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: new. Paperback. This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and X-ray and neutron interferometry. Proceedings of a NATO ASI held in Erice, Italy, April 9-21, 1996 Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Anbieter: Basi6 International, Irving, TX, USA
EUR 164,88
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbZustand: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
EUR 164,88
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbZustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Anbieter: ALLBOOKS1, Direk, SA, Australien
EUR 182,01
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
EUR 203,22
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbZustand: New. pp. 430 1st Edition.
EUR 213,31
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbZustand: New. pp. 430.
EUR 217,93
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbZustand: New. pp. 430.
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
EUR 268,44
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Like New. Like New. book.
Verlag: Springer US, Chapman And Hall/CRC Okt 2012, 2012
ISBN 10: 1461376963 ISBN 13: 9781461376965
Sprache: Englisch
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
EUR 53,49
Währung umrechnenAnzahl: 2 verfügbar
In den WarenkorbTaschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This volume collects the proceedings of the 23rd International Course of Crystallography, entitled 'X-ray and Neutron Dynamical Diffraction, Theory and Applications,' which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: - the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, - the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and - X-ray and neutron interferometry. 436 pp. Englisch.
Verlag: Springer-Verlag New York Inc., 2012
ISBN 10: 1461376963 ISBN 13: 9781461376965
Sprache: Englisch
Anbieter: THE SAINT BOOKSTORE, Southport, Vereinigtes Königreich
EUR 68,32
Währung umrechnenAnzahl: Mehr als 20 verfügbar
In den WarenkorbPaperback / softback. Zustand: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 852.
Anbieter: moluna, Greven, Deutschland
EUR 48,37
Währung umrechnenAnzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of a NATO ASI held in Erice, Italy, April 9-21, 1996This volume collects the proceedings of the 23rd International Course of Crystallography, entitled X-ray and Neutron Dynamical Diffraction, Theory and Applications, which took place in t.
Verlag: Springer US, Springer US Okt 2012, 2012
ISBN 10: 1461376963 ISBN 13: 9781461376965
Sprache: Englisch
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
EUR 53,49
Währung umrechnenAnzahl: 1 verfügbar
In den WarenkorbTaschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This volume collects the proceedings of the 23rd International Course of Crystallography, entitled 'X-ray and Neutron Dynamical Diffraction, Theory and Applications,' which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: ¿ the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, ¿ the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and ¿ X-ray and neutron interferometry.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 436 pp. Englisch.