Applied Life Data Analysis

Nelson, Wayne

ISBN 10: 0471094587 / ISBN 13: 9780471094586

Verlag: New York - Chichester - Brisbane, etc.: John Wiley & Sons, 1982, New York - Chichester - Brisbane, etc., 1982

Beschreibung

Navy Bllue & Red Cloth. Very Good+/Good. First Printing. Hardback. 8vo - over 7¾" - 9¾" tall. 634 pages; 18 p. index; 'References,' 14 p.; this book is one in the 'Wiley Series in Probability and Mathematical Statistics:' Ralph A. Bradley (etc) editors; from the dj: "This practical, highly readable work presents the latest methods in life data analysis--both simple and sophisticated ones for predicting the time-to-failure of a product or living organism. Life data analysis is currently used to predict warranty costs, evaluate replacement policies, assess design changes, and compare alternate designs, vendors, materials, and manufacturing methods. It is also a valuable tool in the comparison of alternative medical treatments. ,A valuable working reference for test and reliability engineers, product designers, mechanical and electrical engineers, statisticians and biostatisticians. 'Applied Life Data Analysis' also serves as a text for upper level undergraduate and graduate courses.".

Bestandsnummer des Verkäufers 002275

Bibliografische Details

• Titel: Applied Life Data Analysis
• Verlag: New York - Chichester - Brisbane, etc.: John Wiley & Sons, 1982, New York - Chichester - Brisbane, etc.
• Veröffentlichungsdatum: 1982
• Sprache: Englisch
• ISBN-10: 0471094587
• ISBN-13: 9780471094586
• Bindung: Navy Bllue & Red Cloth
• Ausgabe: First Printing
• Zustand: Very Good+
• Zustand des Schutzumschlags: Good

Über diesen Titel

Inhaltsangabe

Applied Life Data Analysis is a practical guide to statistical methods for predicting product life and reliability, and comparing improvements in product manufacturing, design, and application. It describes the use of graphical methods, the method of maximum likelihood, censored data analysis, linear estimation, prediction methods, and methods for complete, singly censored, multiply censored, interval, and quantalresponse data.

Über die Autorin bzw. den Autor

DR. WAYNE NELSON IS AWARDED THE SHEWHART MEDAL American Society for Quality awarded Dr. Wayne Nelson of Schenectady, New York the 2003 Shewhart Medal. The Medal honors his outstanding technical leadership, particularly for innovative developments and applications of theory and methods for analyzing quality, reliability, and accelerated test data, and for widely disseminating such developments through his books and many publications, talks, and courses. The Shewhart Medal for outstanding technical leadership is named after Dr. Walter A. Shewhart, who pioneered statistical methods for controlling and improving the quality of manufactured products. These methods contributed significantly to the United States' war effort in World War II. Subsequently taken to Japan by Dr. W. Edwards Deming, these methods revolutionized Japan's industries. Today these methods are part of widely used Six Sigma training on how to improve the quality of products and services. The American Society for Quality is the world's largest professional society dedicated to the improved quality of products and services. It serves its members and the public through a variety of educational activities, including conferences, training courses, journals, and books. Dr. Nelson is a graduate of the California Institute of Technology (Caltech) and the University of Illinois. Formerly with GE Research & Development, he now privately consults and gives courses for companies, professional societies, and universities. For his technical contributions, he was elected a Fellow of the American Society for Quality, the American Statistical Association, and the Institute of Electrical and Electronic Engineers. He recently spent four months in Argentina on a Fulbright Award, lecturing on analysis of product reliability data.