CMOS SRAM Circuit Design and Parametric Test in Nano-scaled Technologies
Pavlov, Andrei; Sachdev, Manoj
ISBN 10: 904817855X ISBN 13: 9789048178551
Verlag: Springer, 2010
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Softcover
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Beschreibung
Beschreibung:
This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Series: Frontiers in Electronic Testing. Num Pages: 210 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 305. . 2010. 1st ed. Softcover of orig. ed. 2008. Paperback. . . . . Bestandsnummer des Verkäufers V9789048178551
Inhaltsangabe:
This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.
Über die Autorin bzw. den Autor: Prof. Sachdev has authored several successful books with Springer
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Bibliografische Details
Titel: CMOS SRAM Circuit Design and Parametric Test...
Verlag: Springer
Erscheinungsdatum: 2010
Einband: Softcover
Zustand: New
Auflage: 1. Auflage
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Paperback)
Verlag:
Springer, Dordrecht, 2010
ISBN 10: 904817855X
ISBN 13: 9789048178551
Neu
Paperback
Erstausgabe
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Verkäuferbewertung 5 von 5 Sternen
Paperback. Zustand: new. Paperback. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Bestandsnummer des Verkäufers 9789048178551
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Paperback)
Verlag:
Springer, Dordrecht, 2010
ISBN 10: 904817855X
ISBN 13: 9789048178551
Neu
Paperback
Erstausgabe
Anbieter: AussieBookSeller, Truganina, VIC, Australien
Verkäuferbewertung 5 von 5 Sternen
Paperback. Zustand: new. Paperback. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Bestandsnummer des Verkäufers 9789048178551
Anzahl: 1 verfügbar