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Verlag: Springer, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Anbieter: booksXpress, Bayonne, NJ, USA
Buch
Soft Cover. Zustand: new.
Verlag: Springer, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Anbieter: Lucky's Textbooks, Dallas, TX, USA
Buch
Zustand: New.
Verlag: Springer, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
Buch Print-on-Demand
Zustand: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Verlag: Springer US Nov 2012, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Deutschland
Buch Print-on-Demand
Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. 272 pp. Englisch.
Verlag: Springer US, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Anbieter: moluna, Greven, Deutschland
Buch Print-on-Demand
Kartoniert / Broschiert. Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This must have reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical fa.
Verlag: Springer US, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
Verlag: Springer, 2012
ISBN 10: 1461372313ISBN 13: 9781461372318
Anbieter: Mispah books, Redhill, SURRE, Vereinigtes Königreich
Buch
Paperback. Zustand: Like New. Like New. book.