System-on-Chip Test Architectures: Nanometer Design for Testability (Volume .) (Systems on Silicon, Volume .) - Hardcover

Wang, Laung-Terng; Stroud, Charles E.; Touba, Nur A.

 
9780123739735: System-on-Chip Test Architectures: Nanometer Design for Testability (Volume .) (Systems on Silicon, Volume .)
Hardcover
ISBN 10: 012373973X ISBN 13: 9780123739735
Verlag: Morgan Kaufmann, 2008

Inhaltsangabe

Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs.

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Über die Autorin bzw. den Autor

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

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Verlag
Morgan Kaufmann
Erscheinungsdatum
2008
Sprache
Englisch
ISBN 10 
012373973X
ISBN 13 
9780123739735
Einband
Gebundene Ausgabe
Anzahl der Seiten
896
Kontakt zum Hersteller
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Verantwortliche Person
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