Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing, 37, Band 37) - Hardcover

Buch 19 von 40: Frontiers in Electronic Testing
 
9780387747460: Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing, 37, Band 37)
Hardcover
ISBN 10: 038774746X ISBN 13: 9780387747460
Verlag: Springer, 2008

Inhaltsangabe

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

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Von der hinteren Coverseite

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
Springer
Erscheinungsdatum
2008
Sprache
Englisch
ISBN 10 
038774746X
ISBN 13 
9780387747460
Einband
Gebundene Ausgabe
Anzahl der Seiten
420
Herausgeber
Tehranipoor Mohammad
Kontakt zum Hersteller
ProductSafety@springernature.com
ProductSafety@springernature.com

Poststr. 9
Darmstadt
64293
Deutschland

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9781441945136: Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing, Band 37)

Vorgestellte Ausgabe

ISBN 10:  144194513X ISBN 13:  9781441945136
Verlag: Springer, 2010
Softcover