Verwandte Artikel zu Semiconductor material and device characterization
Inhaltsangabe
Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques. This newly revamped and expanded Second Edition incorporates the many innovations that have come to dominate the field during the past decade. From scanning probe techniques to the detection of metallic impurities in silicon wafers to the use of microwave reflection to measure contactless resistivity, each chapter presents state-of-the-art tools and techniques, most of which were in their infancy or had not yet been developed when the previous edition first came out. Featured here are: An entirely new chapter on reliability and probe microscopy Numerous examples and end-of-chapter problems - new to this edition Five hundred illustrations revised for this edition Updated bibliography with over 1,200 references Easy-to-use text including a real-world mix of units rather than strictly MKS units. This practical new edition is ideal for textbook adoptions at the graduate level and is destined to become an essential reference for research and development teams in the semiconductor industry.
Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.
Über die Autorin bzw. den Autor
DIETER K. SCHRODER is Professor in the Department of Electrical Engineering at Arizona State University. A recipient of the ASU College of Engineering Teaching Excellence Award, he is author of Advanced MOS Devices.
„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.
EUR 12,15
EUR 5,76 für den Versand von Vereinigtes Königreich nach Deutschland
Versandziele, Kosten & DauerNeu kaufen
Diesen Artikel anzeigen
EUR 56,27
EUR 38,41 für den Versand von USA nach Deutschland
Versandziele, Kosten & DauerWeitere beliebte Ausgaben desselben Titels
Suchergebnisse für Semiconductor material and device characterization
Beispielbild für diese ISBN
Semiconductor Material and Device Characterization
Verlag:
Wiley & Sons, Incorporated, John, 1998
ISBN 10: 0471241393
ISBN 13: 9780471241393
Gebraucht
Hardcover
Anbieter: Better World Books Ltd, Dunfermline, Vereinigtes Königreich
Verkäuferbewertung 5 von 5 Sternen
Zustand: Very Good. Ships from the UK. Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects. Bestandsnummer des Verkäufers 41151332-20
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Semiconductor Material and Device Characterization
Anbieter: ThriftBooks-Dallas, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Fair. No Jacket. Missing dust jacket; Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less 2.73. Bestandsnummer des Verkäufers G0471241393I5N01
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Semiconductor Material and Device Characterization
Anbieter: Feldman's Books, Menlo Park, CA, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Very Fine. Second Edition. No markings. Bestandsnummer des Verkäufers 00044737
Anzahl: 1 verfügbar
Foto des Verkäufers
Semiconductor Material and Device Characterization
Anbieter: Goodwill of Silicon Valley, SAN JOSE, CA, USA
Verkäuferbewertung 4 von 5 Sternen
Zustand: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact. Bestandsnummer des Verkäufers GWSVV.0471241393.A
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Semiconductor Material and Device Characterization
Anbieter: The Book Spot, Sioux Falls, MN, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: New. Bestandsnummer des Verkäufers Abebooks117579
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Semiconductor Material and Device Characterization
Anbieter: HPB-Red, Dallas, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Bestandsnummer des Verkäufers S_433131788
Anzahl: 1 verfügbar
Beispielbild für diese ISBN
Semiconductor Material and Device Characterization
Anbieter: Toscana Books, AUSTIN, TX, USA
Verkäuferbewertung 5 von 5 Sternen
Hardcover. Zustand: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks. Bestandsnummer des Verkäufers Scanned0471241393
Anzahl: 1 verfügbar