Inhaltsangabe
This detailed sourcebook provides an up-to-date description and unified treatment of the characterization techniques used in the semiconductor industry. It covers electrical, optical, electron- beam, ion-beam, X-ray and gamma ray methods. This information, until now scattered in journals and review papers, is presented in a unified manner with over 1300 references. It is also a valuable reference book on characterization methods.
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This detailed sourcebook provides an up-to-date description and unified treatment of the characterization techniques used in the semiconductor industry. It covers electrical, optical, electron- beam, ion-beam, X-ray and gamma ray methods. This information, until now scattered in journals and review papers, is presented in a unified manner with over 1300 references. It is also a valuable reference book on characterization methods.
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Semiconductor Material and Device Characterization
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Semiconductor Material and Device Characterization
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Wiley & Sons, Incorporated, John, 1990
ISBN 10: 0471511048
ISBN 13: 9780471511045
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Semiconductor Material and Device Characterization
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Semiconductor Material and Device Characterization
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Semiconductor Material and Device Characterization
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Semiconductor Material and Device Characterization
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Semiconductor Material and Device Characterization
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Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1990
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Semiconductor Material and Device Characterization
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John Wiley & Sons Inc, NY, 1990
ISBN 10: 0471511048
ISBN 13: 9780471511045
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Semiconductor Material and Device Characterization - 1st Edition/1st Printing
Verlag:
John Wiley & Sons, Inc., New York, 1990
ISBN 10: 0471511048
ISBN 13: 9780471511045
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Semiconductor Material and Device Characterization
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