Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2, Band 2) - Softcover

Buch 4 von 241: NATO Science Series II: Mathematics, Physics and Chemistry
 
9780792366867: Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2, Band 2)
Softcover
ISBN 10: 0792366867 ISBN 13: 9780792366867
Verlag: Springer, 2009

Inhaltsangabe

Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
Springer
Erscheinungsdatum
2009
Sprache
Englisch
ISBN 10 
0792366867
ISBN 13 
9780792366867
Einband
Taschenbuch
Anzahl der Seiten
636
Herausgeber
Pacchioni Gianfranco
Kontakt zum Hersteller
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Darmstadt
64293
Deutschland

Weitere beliebte Ausgaben desselben Titels

9780792366850: Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2, Band 2)

Vorgestellte Ausgabe

ISBN 10:  0792366859 ISBN 13:  9780792366850
Verlag: Springer, 2000
Hardcover