Verwandte Artikel zu Electrothermal Analysis of VLSI Systems

Electrothermal Analysis of VLSI Systems - Hardcover

Yi-Kan Cheng; Ching-Han Tsai; Chin-Chi Teng; Sung-Mo (Steve) Kang

 
9780792378617: Electrothermal Analysis of VLSI Systems
Hardcover
ISBN 10: 079237861X ISBN 13: 9780792378617
Verlag: Springer, 2000

Inhaltsangabe

Electrothermal Analysis of VLSI Systems addresses electrothermal problems in modern VLSI systems.
Part I, The Building Blocks, discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires (including power analysis, temperature-dependent device modeling, thermal/electrothermal simulation, and experimental setup-calibration).
Part II, The Applications, discusses three important applications of VLSI electrothermal analysis including temperature-dependent electromigration diagnosis, cell-level thermal placement and temperature-driven power and timing analysis.
Electrothermal Analysis of VLSI Systems will be useful for researchers in the fields of IC reliability analysis and physical design, as well as VLSI designers and graduate students.

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Verlag
Springer
Erscheinungsdatum
2000
Sprache
Englisch
ISBN 10 
079237861X
ISBN 13 
9780792378617
Einband
Gebundene Ausgabe
Anzahl der Seiten
233
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