Multi-Chip Module Test Strategies (Frontiers in Electronic Testing, Band 7) - Hardcover

Buch 2 von 40: Frontiers in Electronic Testing
 
9780792399209: Multi-Chip Module Test Strategies (Frontiers in Electronic Testing, Band 7)
Hardcover
ISBN 10: 079239920X ISBN 13: 9780792399209
Verlag: Springer, 1997

Inhaltsangabe

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.
Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.
Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

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Verlag
Springer
Erscheinungsdatum
1997
Sprache
Englisch
ISBN 10 
079239920X
ISBN 13 
9780792399209
Einband
Gebundene Ausgabe
Auflage
1
Anzahl der Seiten
167
Herausgeber
Zorian Yervant
Kontakt zum Hersteller
Springer-Verlag GmbH
customerservice@springernature.com

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Heidelberg
Baden-Württemberg
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Deutschland

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