Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard: 22B (Frontiers in Electronic Testing) - Softcover

Nicolici, Nicola; Al-Hashimi, Bashir M.

 
9781441953155: Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard: 22B (Frontiers in Electronic Testing)
Softcover
ISBN 10: 1441953159 ISBN 13: 9781441953155
Verlag: Springer, 2010

Inhaltsangabe

Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density.

Power-Constrained Testing of VLSI Circuits focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented.

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Reseña del editor

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

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Verlag
Springer
Erscheinungsdatum
2010
Sprache
Englisch
ISBN 10 
1441953159
ISBN 13 
9781441953155
Einband
Tapa blanda
Anzahl der Seiten
192
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
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Hamburg
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Weitere beliebte Ausgaben desselben Titels

9781402072352: Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard: 22B (Frontiers in Electronic Testing)

Vorgestellte Ausgabe

ISBN 10:  140207235X ISBN 13:  9781402072352
Verlag: Springer, 2003
Hardcover