VLSI Design for Manufacturing: Yield Enhancement: 86 (The Springer International Series in Engineering and Computer Science) - Softcover

Director, Stephen W. W.; Maly, Wojciech; Strojwas, Andrzej J.

 
9781461288169: VLSI Design for Manufacturing: Yield Enhancement: 86 (The Springer International Series in Engineering and Computer Science)
Softcover
ISBN 10: 1461288169 ISBN 13: 9781461288169
Verlag: Springer, 2011

Inhaltsangabe

One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.

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Reseña del editor

One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design". As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.

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Verlag
Springer
Erscheinungsdatum
2011
Sprache
Englisch
ISBN 10 
1461288169
ISBN 13 
9781461288169
Einband
Tapa blanda
Anzahl der Seiten
308
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
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Weitere beliebte Ausgaben desselben Titels

9780792390541: VLSI Design for Manufacturing: Yield Enhancement: 86 (The Springer International Series in Engineering and Computer Science)

Vorgestellte Ausgabe

ISBN 10:  0792390547 ISBN 13:  9780792390541
Verlag: Springer, 1989
Hardcover