High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, 50, Band 50) - Hardcover

Buch 66 von 233: Springer Series in Materials Science
 
9783540418184: High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, 50, Band 50)
Hardcover
ISBN 10: 3540418180 ISBN 13: 9783540418184
Verlag: Springer, 2002

Inhaltsangabe

The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma­ terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.

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Von der hinteren Coverseite

This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

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Verlag
Springer
Erscheinungsdatum
2002
Sprache
Englisch
ISBN 10 
3540418180
ISBN 13 
9783540418184
Einband
Gebundene Ausgabe
Anzahl der Seiten
456
Herausgeber
Ernst Frank, Rühle Manfred
Kontakt zum Hersteller
preigu GmbH & Co. KG
mail@preigu.de

Lengericher Landstr. 19
Osnabrück
Niedersachsen
49078
Deutschland

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9783642075254: High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science, Band 50)

Vorgestellte Ausgabe

ISBN 10:  3642075258 ISBN 13:  9783642075254
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Softcover