Transmission Electron Microscopy and Diffractometry of Materials (Advanced Texts in Physics) - Hardcover

Fultz, Brent; Howe, James

Hardcover

ISBN 10: 3540437649 ISBN 13: 9783540437642

Verlag: Springer, 2005

Inhaltsangabe

This practical and theoretical text/reference develops the concepts of transmission electron microscopy and x-ray diffractometry. This acclaimed new edition contains many improved explanations and new material on high-resolution microscopy.

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This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2005
• Sprache: Englisch
• ISBN 10: 3540437649
• ISBN 13: 9783540437642
• Einband: Gebundene Ausgabe
• Auflage: 2
• Anzahl der Seiten: 769
• Kontakt zum Hersteller: Nicht verfügbar
• Verantwortliche Person: CMN Printpool Inh. Mathis Neumann; https://www.also.com/ec/cms5/en_6000/6000/index.jsp; ; Friedrich-Karl-Str. 9; Hamburg; Deutschland