High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics Vol. 149): High Resolution X-Ray Scattering from ... Ergebnisse der exakten Naturwissenschaften) - Hardcover

Buch 59 von 227: Springer Tracts in Modern Physics

Holy, Vaclav; Pietsch, Ullrich; Baumbach, Tilo

 
9783540620297: High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics Vol. 149): High Resolution X-Ray Scattering from ... Ergebnisse der exakten Naturwissenschaften)
Hardcover
ISBN 10: 354062029X ISBN 13: 9783540620297
Verlag: Springer-Verlag Berlin Heidelberg, 1998

Inhaltsangabe

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.

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This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.

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Verlag
Springer-Verlag Berlin Heidelberg
Erscheinungsdatum
1998
Sprache
Englisch
ISBN 10 
354062029X
ISBN 13 
9783540620297
Einband
Gebundene Ausgabe
Anzahl der Seiten
269
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
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