Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics, Band 209) - Softcover

Buch 109 von 227: Springer Tracts in Modern Physics

Schubert, Mathias

 
9783642062285: Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics, Band 209)
Softcover
ISBN 10: 3642062288 ISBN 13: 9783642062285
Verlag: Springer, 2010

Inhaltsangabe

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects.

A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

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Verlag
Springer
Erscheinungsdatum
2010
Sprache
Englisch
ISBN 10 
3642062288
ISBN 13 
9783642062285
Einband
Taschenbuch
Anzahl der Seiten
208
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Weitere beliebte Ausgaben desselben Titels

9783540232490: Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer Tracts in Modern Physics, 209, Band 209)

Vorgestellte Ausgabe

ISBN 10:  3540232494 ISBN 13:  9783540232490
Verlag: Springer, 2004
Hardcover