Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - Softcover

Buch 38 von 126: Graduate Texts in Physics

Fultz, Brent; Howe, James

 
9783642433153: Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Softcover
ISBN 10: 3642433154 ISBN 13: 9783642433153
Verlag: Springer, 2014

Inhaltsangabe

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Über die Autorin bzw. den Autor

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials.

 

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.

Von der hinteren Coverseite

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
Springer
Erscheinungsdatum
2014
Sprache
Englisch
ISBN 10 
3642433154
ISBN 13 
9783642433153
Einband
Taschenbuch
Auflage
4
Anzahl der Seiten
784
Kontakt zum Hersteller
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Darmstadt
64293
Deutschland

Weitere beliebte Ausgaben desselben Titels

9783642297601: Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)

Vorgestellte Ausgabe

ISBN 10:  3642297609 ISBN 13:  9783642297601
Verlag: Springer, 2012
Hardcover