Verwandte Artikel zu Surface Roughness Study by Atomic Force Microscopy:...

Surface Roughness Study by Atomic Force Microscopy: Surface Roughness-Practical Example - Softcover

Sayeed, Md.Abu; Ferdous, Zakia

 
9783848400355: Surface Roughness Study by Atomic Force Microscopy: Surface Roughness-Practical Example
Softcover
ISBN 10: 3848400359 ISBN 13: 9783848400355
Verlag: LAP LAMBERT Academic Publishing, 2012

Inhaltsangabe

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

Die Inhaltsangabe kann sich auf eine andere Ausgabe dieses Titels beziehen.

Verlag
LAP LAMBERT Academic Publishing
Erscheinungsdatum
2012
Sprache
Englisch
ISBN 10 
3848400359
ISBN 13 
9783848400355
Einband
Taschenbuch
Anzahl der Seiten
72
Kontakt zum Hersteller
Nicht verfügbar
Verantwortliche Person
VDM Verlag Dr. Müller
customerservice@vdm-vsg.de

Brivibas gatve 197
Riga
1039
Lettland