Novel Algorithms for Fast Statistical Analysis of Scaled Circuits: 46 (Lecture Notes in Electrical Engineering) - Hardcover

Singhee, Amith; Rutenbar, Rob A.

Hardcover

ISBN 10: 9048130999 ISBN 13: 9789048130993

Verlag: Springer, 2009

Inhaltsangabe

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.

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Über die Autorin bzw. den Autor

Charlotte y Peter Fiell son dos autoridades en historia, teoría y crítica del diseño y han escrito más de sesenta libros sobre la materia, muchos de los cuales se han convertido en éxitos de ventas. También han impartido conferencias y cursos como profesores invitados, han comisariado exposiciones y asesorado a fabricantes, museos, salas de subastas y grandes coleccionistas privados de todo el mundo. Los Fiell han escrito numerosos libros para TASCHEN, entre los que se incluyen 1000 Chairs, Diseño del siglo XX, El diseño industrial de la A a la Z, Scandinavian Design y Diseño del siglo XXI.

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As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime. In particular, Novel Algorithms for Fast Statistical Analysis of Scaled Circuits makes three contributions:

1) SiLVR, a nonlinear response surface modeling and performance-driven dimensionality reduction strategy, that automatically captures the designer s insight into the circuit behavior, by extracting quantitative measures of relative global sensitivities and nonlinear correlation.

2) Fast Monte Carlo simulation of circuits using quasi-Monte Carlo, showing speedups of 2× to 50× over standard Monte Carlo.

3) Statistical blockade, an efficient method for sampling rare events and estimating their probability distribution using limit results from extreme value theory, applied to high replication circuits like SRAM cells.

Details zur Ausgabe

• Verlag: Springer
• Erscheinungsdatum: 2009
• ISBN 10: 9048130999
• ISBN 13: 9789048130993
• Einband: Tapa dura
• Sprache: Englisch
• Anzahl der Seiten: 212
• Kontakt zum Hersteller: Nicht verfügbar