DIGITAL NOISE MONITORING OF DEFECT ORIGIN
TELMAN ALIEV
Verkauft von Basi6 International, Irving, TX, USA
AbeBooks-Verkäufer seit 24. Juni 2016
Neu - Hardcover
Zustand: Neu
Anzahl: 1 verfügbar
In den Warenkorb legenVerkauft von Basi6 International, Irving, TX, USA
AbeBooks-Verkäufer seit 24. Juni 2016
Zustand: Neu
Anzahl: 1 verfügbar
In den Warenkorb legenNew. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Bestandsnummer des Verkäufers ABEJUNE24-87571
This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.
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