Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)

Manoj Sachdev

ISBN 10: 0792380835 / ISBN 13: 9780792380832

Verlag: Springer, 1997

Beschreibung

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Bestandsnummer des Verkäufers S_410334443

Bibliografische Details

• Titel: Defect Oriented Testing for CMOS Analog and Digital Circuits (Frontiers in Electronic Testing)
• Verlag: Springer
• Erscheinungsjahr: 1997
• Sprache: Englisch
• ISBN-10: 0792380835
• ISBN-13: 9780792380832
• Einband: hardcover
• Zustand: Very Good

Über diesen Titel

Inhaltsangabe

Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality, and many factors have contributed to their industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market-place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex, and demand components of the highest possible quality. Testing in general, and defect-oriented testing in particular, help in realizing these objectives. Providing a detailed overview of the subject, this book is intended for design and test professionals as well as researchers and students working in the field.