High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics)

Holy, Vaclav, Pietsch, Ullrich, Baumbach, Tilo

ISBN 10: 354062029X / ISBN 13: 9783540620297

Verlag: Springer, 1998

Beschreibung

Like New.

Bestandsnummer des Verkäufers ERICA758354062029X5

Bibliografische Details

• Titel: High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics)
• Verlag: Springer
• Erscheinungsjahr: 1998
• Sprache: Englisch
• ISBN-10: 354062029X
• ISBN-13: 9783540620297
• Einband: Hardcover
• Zustand: Like New
• Buchtyp: book

Über diesen Titel

Inhaltsangabe

This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is intended as a reference for experimentalists who want to improve their knowledge on modern X-ray methods for thin film analysis.

Reseña del editor

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:
thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.