Introduction to Scanning Tunneling Microscopy (Oxford Series in Optical and Imaging Sciences) von Chen, C. Julian: Good hardcover (1993)

Beschreibung

Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!

Bestandsnummer des Verk�ufers S_422244805

Verk�ufer kontaktieren

Diesen Artikel melden

Bibliografische Details

Titel: Introduction to Scanning Tunneling Microscopy (Oxford Series in Optical and Imaging Sciences)
Verlag: Oxford University Press
Erscheinungsjahr: 1993
Sprache: Englisch
ISBN-10: 0195071506
ISBN-13: 9780195071504
Einband: hardcover
Zustand: Good

�ber diesen Titel

Inhaltsangabe

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

Rese�a del editor

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

��ber diesen Titel� kann sich auf eine andere Ausgabe dieses Titels beziehen.