Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)

Nicolici, Nicola; Al-Hashimi, Bashir M.

ISBN 10: 140207235X / ISBN 13: 9781402072352

Verlag: Springer, 2003

Beschreibung

In.

Bestandsnummer des Verkäufers ria9781402072352_new

Bibliografische Details

• Titel: Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
• Verlag: Springer
• Erscheinungsjahr: 2003
• Sprache: Englisch
• ISBN-10: 140207235X
• ISBN-13: 9781402072352
• Einband: Hardcover
• Zustand: New

Über diesen Titel

Inhaltsangabe

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.