VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 ? July 2, 2017, Revised Selected Papers

ISBN 10: 9811074690 / ISBN 13: 9789811074691

Verlag: Springer, 2017

Beschreibung

Bestandsnummer des Verkäufers 26376466852

Bibliografische Details

• Titel: VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 ? July 2, 2017, Revised Selected Papers
• Verlag: Springer
• Erscheinungsjahr: 2017
• Sprache: Englisch
• ISBN-10: 9811074690
• ISBN-13: 9789811074691
• Einband: Softcover
• Zustand: New

Über diesen Titel

Inhaltsangabe

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.