VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)

Wen, Xiaoqing,Wu, Cheng-Wen,Wang, Laung-Terng

ISBN 10: 0123705975 / ISBN 13: 9780123705976

Verlag: Morgan Kaufmann, 2006

Beschreibung

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Bestandsnummer des Verkäufers S_444683159

Bibliografische Details

• Titel: VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
• Verlag: Morgan Kaufmann
• Erscheinungsjahr: 2006
• Sprache: Englisch
• ISBN-10: 0123705975
• ISBN-13: 9780123705976
• Einband: Hardcover
• Zustand: Good

Über diesen Titel

Inhaltsangabe

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Über die Autorinnen und Autoren

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.