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  • Sprache: Englisch

    Verlag: Springer, 2006

    3540286039 / 9783540286035

    • Hardcover

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    EUR 681,33

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  • Sprache: Englisch

    Verlag: Springer, 2006

    3662496011 / 9783662496015

    • Softcover

    Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections

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  • Sprache: Englisch

    Verlag: Springer Verlag, 2006

    3540286039 / 9783540286035

    • Hardcover

    Anbieter: Revaluation Books, Exeter, Vereinigtes KönigreichRevaluation Books

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    Zustand: Neu

    EUR 1.032,09

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    Hardcover. Zustand: Brand New. 1st edition. 863 pages. 9.00x6.25x1.50 inches. In Stock.

  • Sprache: Englisch

    Verlag: Springer, 2006

    3662496011 / 9783662496015

    • Softcover

    Anbieter: California Books, Miami, FL, USACalifornia Books

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    Zustand: Neu

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  • Sprache: Englisch

    Verlag: Springer, 2006

    3662496011 / 9783662496015

    • Softcover

    Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH

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    Zustand: Neu

    EUR 794,42

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    Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

  • Sprache: Englisch

    Verlag: Springer, 2006

    3540286039 / 9783540286035

    • Hardcover

    Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH

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    Zustand: Neu

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    Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.

  • Sprache: Englisch

    Verlag: Springer Verlag, 2006

    3662496011 / 9783662496015

    • Softcover

    Anbieter: Revaluation Books, Exeter, Vereinigtes KönigreichRevaluation Books

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    Zustand: Neu

    EUR 1.030,49

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    Paperback. Zustand: Brand New. 2006 edition. 878 pages. 9.25x6.10x2.01 inches. In Stock.

  • Sprache: Englisch

    Verlag: Springer, 2006

    3662496011 / 9783662496015

    • Softcover
    • Print-on-Demand

    Anbieter: Brook Bookstore On Demand, Napoli, NA, ItalienBrook Bookstore On Demand

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    EUR 566,49

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    Zustand: new. Questo è un articolo print on demand.

  • Sprache: Englisch

    Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    3540286039 / 9783540286035

    • Hardcover
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    Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschlandbuchversandmimpf2000

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    Buch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch.

  • Sprache: Englisch

    Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    3662496011 / 9783662496015

    • Softcover
    • Print-on-Demand

    Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschlandbuchversandmimpf2000

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    Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch.

  • Sprache: Englisch

    Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    3662496011 / 9783662496015

    • Softcover
    • Print-on-Demand

    Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, DeutschlandBuchWeltWeit Ludwig Meier e.K.

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    EUR 748,99

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    Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students. 904 pp. Englisch.

  • Sprache: Englisch

    Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006

    3540286039 / 9783540286035

    • Hardcover
    • Print-on-Demand

    Anbieter: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, DeutschlandBuchWeltWeit Ludwig Meier e.K.

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    Zustand: Neu

    EUR 748,99

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    Anzahl: 2 verfügbar

    Buch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. 904 pp. Englisch.

  • Sprache: Englisch

    Verlag: Springer Berlin Heidelberg, 2006

    3662496011 / 9783662496015

    • Softcover
    • Print-on-Demand

    Anbieter: moluna, Greven, Deutschlandmoluna

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    Zustand: Neu

    EUR 619,04

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    Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The most comprehensive and latest&nbspcore reference&nbspin this field Makes it a must for all the analytical laboratories and individual analysts because of its user orientation The most comprehensive and latest core reference in thi.

  • Sprache: Englisch

    Verlag: Springer Berlin Heidelberg, 2006

    3540286039 / 9783540286035

    • Hardcover
    • Print-on-Demand

    Anbieter: moluna, Greven, Deutschlandmoluna

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    Zustand: Neu

    EUR 619,04

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    Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The most comprehensive and latest&nbspcore reference&nbspin this field Makes it a must for all the analytical laboratories and individual analysts because of its user orientation The most comprehensive and latest core reference in thi.