epperlein peter (22 Ergebnisse)

Zustand: very_good.

Zustand: Very Good. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Zustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.

Zustand: new.

Zustand: New.

Zustand: New.

Zustand: New. pp. 522.

Hardback. Zustand: New. New copy - Usually dispatched within 4 working days.

Zustand: New. This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Num Pages: 522 pages, Illustrations. BIC Classification: TJFD5; TTBL. Category: (P) Professional & Vocational. Dimension: 236 x 161 x 30. Weight in Grams: 780. . 2013. 1st Edition. Hardcover. . . . .

Zustand: New. pp. 522 Index.

Zustand: New. This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Num Pages: 522 pages, Illustrations. BIC Classification: TJFD5; TTBL. Category: (P) Professional & Vocational. Dimension: 236 x 161 x 30. Weight in Grams: 780. . 2013. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.

Hardcover. Zustand: Brand New. 1st edition. 522 pages. 9.00x6.00x1.25 inches. In Stock.

Zustand: As New. Unread book in perfect condition.

Hardcover. Zustand: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Zustand: As New. Unread book in perfect condition.

Buch. Zustand: Neu. Neuware - This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities.Further key features include:\* practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues;\* detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application;\* systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers;\* coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program.Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.Dr. Peter W. Epperlein is Technology Consultant with his own semiconductor technology consulting business Pwe-PhotonicsElectronics-IssueResolution in the UK. He looks back at a thirty years career in cutting edge photonics and electronics industries with focus on emerging technologies, both in global and start-up companies, including IBM, Hewlett-Packard, Agilent Technologies, Philips/NXP, Essient Photonics and IBM/JDSU Laser Enterprise. He holds Pre-Dipl. (B.Sc.), Dipl. Phys. (M.Sc.) and Dr. rer. nat. (Ph.D.) degrees in physics, magna cum laude, from the University of Stuttgart, Germany.Dr. Epperlein is an internationally recognized expert in compound semiconductor and diode laser technologies. He has accomplished R&D in many device areas such as semiconductor lasers, LEDs, optical modulators, quantum well devices, resonant tunneling devices, FETs, and superconducting tunnel junctions and integrated circuits. His pioneering work on sophisticated diagnostic research has led to many world's first reports and has been adopted by other researchers in academia and industry. He authored more than seventy peer-reviewed journal papers, published more than ten invention disclosures in the IBM Technical Disclosure Bulletin, has served as reviewer of numerous proposals for publication in technical journals, and has won five IBM Research Division Awards. His key achievements include the design and fabrication of high-power, highly reliable, single mode diode lasers.

Nr. 1 - Das Ende der Reichskanzlei + Nr. 4 -Boot Krieg 1914 - 1918 + Nr. 6 - Rastatt 1849 - Eine Festung der Revolution + Nr. 7 - Tod dem König - Es lebe die Republik ! + Nr. 10 - Die Entstehung der USA + Nr. 11 - Der Gang nach Canossa + NR. 12 - Südafrika Apartheid - Befreiungskampf + Nr. 13 - Der Weg nach Königgrätz 1866 + Nr. 15 - Waterloo 1815 + Nr. 22 - Kreuzzug gegen die Stedinger 1233 /34 + Nr. 25 Flucht nach Weimar 1918 / 1919 + Nr. 26 - Albert Einstein - Physiker und Humanist + Nr. 27 - Weberaufstand im Eulengebirge 1844 + Nr. 30 - Hauptstoßrichtung Berlin + Nr. 31 - Luther in Worms 1521+ Nr. 32 - Bölterschlacht bei Leipzig 1813 + Nr. 36 - Die Potsdamer Konferenz + Nr. 39 - thomas - Rebell und Gegenkaiser in Byzanz + Nr. 42 - Die Schlacht bei Jena und Auerstedt + Nr. 43 - Die Schlacht im Teutoburger Wald + Nr. 44 - Bismarcks Ausnahmegesetz gegen die Sozialdemokratie + Nr. 47 - Kampf um die Prärie - Der Freiheitskampf der nordamerikanischen Prärieindianer + Nr. 48 " Panthersprung " nach Agadir 1911 + Nr. 49 - Peter der Grosse - Zar und Reformer + Nr. 53 - Fall Weiß - Entfesselung des zweiten Weltkrieges, alle Hefte 8°, Obrosch, teilweise z. T. mehrfarbige Bebilderung im Text, Mischauflage, Einbände minimal lichtrandig, guter Zustand, über 1000 g.

Hardcover. Zustand: new. Hardcover. This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues;detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application;systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers;coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Hardcover. Zustand: Brand New. 1st edition. 522 pages. 9.00x6.00x1.25 inches. In Stock. This item is printed on demand.

Hardcover. Zustand: new. Hardcover. This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. Diode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities. Further key features include: practical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues;detailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application;systematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers;coverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program. Semiconductor Laser Engineering, Reliability and Diagnostics reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students. This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

Hardback. Zustand: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 810.