Jan rhensius (5 Ergebnisse)

Taschenbuch. Zustand: Neu. Spin Dynamics and Spin Configuration in Nanopatterned Elements | Experimental results on patterned ferromangetic half-metals and field- & current-induced dynamics in Permalloy | Jan Rhensius | Taschenbuch | 156 S. | Englisch | 2015 | Südwestdeutscher Verlag für Hochschulschriften | EAN 9783838108230 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…

Taschenbuch. Zustand: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This thesis gives new insights to the field of current- and field-induced domain wall dynamics phenomena in nanopatterned elements and of the role of the different energy terms to the spin configuration of half-metallic systems. Time resolved imaging allows for the determination of the effective domain wall mass and the underlying physical origins. In current-induced domain wall displacement experiments, the influence of edge roughness-induced pinning was identified as having a big influence on the critical current density that is needed to displace a domain wall in a magnetic micro- or nanowire. By applying a specially developed patterning method, the domain wall pinning at edge defects was highly reduced and the device performance was improved by a factor of four, compared to conventionally produced wires. Patterning methods for ferromagnetic half-metals were also developed and the spin structure of structured elements are characterized. 156 pp. Englisch.…

Zustand: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Rhensius JanDr. Jan Rhensius studied physics from 2002 to 2007 in Duisburg (de) and received his doctor s degree in 2011 from the University of Konstanz (de) in collaboration with the Paul Scherrer Institut (ch).His research focusses.…

Taschenbuch. Zustand: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This thesis gives new insights to the field of current- and field-induced domain wall dynamics phenomena in nanopatterned elements and of the role of the different energy terms to the spin configuration of half-metallic systems. Time resolved imaging allows for the determination of the effective domain wall mass and the underlying physical origins. In current-induced domain wall displacement experiments, the influence of edge roughness-induced pinning was identified as having a big influence on the critical current density that is needed to displace a domain wall in a magnetic micro- or nanowire. By applying a specially developed patterning method, the domain wall pinning at edge defects was highly reduced and the device performance was improved by a factor of four, compared to conventionally produced wires. Patterning methods for ferromagnetic half-metals were also developed and the spin structure of structured elements are characterized.…

Taschenbuch. Zustand: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This thesis gives new insights to the field of current- and field-induced domain wall dynamics phenomena in nanopatterned elements and of the role of the different energy terms to the spin configuration of half-metallic systems. Time resolved imaging allows for the determination of the effective domain wall mass and the underlying physical origins. In current-induced domain wall displacement experiments, the influence of edge roughness-induced pinning was identified as having a big influence on the critical current density that is needed to displace a domain wall in a magnetic micro- or nanowire. By applying a specially developed patterning method, the domain wall pinning at edge defects was highly reduced and the device performance was improved by a factor of four, compared to conventionally produced wires. Patterning methods for ferromagnetic half-metals were also developed and the spin structure of structured elements are characterized.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 156 pp. Englisch.…